Elsevier

Vacuum

Volume 85, Issue 1, 23 July 2010, Pages 69-77
Vacuum

Mechanical properties optimization of tungsten nitride thin films grown by reactive sputtering and laser ablation

https://doi.org/10.1016/j.vacuum.2010.04.004Get rights and content

Abstract

Transition metal nitrides coatings are used as protective coatings against wear and corrosion. Their mechanical properties can be tailored by tuning the nitrogen content during film synthesis. The relationship between thin film preparation conditions and mechanical properties for tungsten nitride films is not as well understood as other transition metal nitrides, like titanium nitride. We report the synthesis of tungsten nitride films grown by reactive sputtering and laser ablation in the ambient of N2 or N2/Ar mixture at various pressures on stainless steel substrates at 400  C. The composition of the films was determined by XPS. The optimal mechanical properties were found by nanoindentation based on the determination of the proper deposition conditions. As nitrogen pressure was increased during processing, the stoichiometry and hardness changed from W9N to W4N and 30.8–38.7 GPa, respectively, for films deposited by reactive sputtering, and from W6N to W2N and 19.5–27.7 GPa, respectively, for those deposited by laser ablation.

Introduction

The term of hard coatings is applied to structures which improve wear resistance and extend the lifetime of the structure. Hard coatings are industrially used onto cutting tools, automotive engine parts, turbine blades, structural components, etc [1], [2]. Traditionally, materials utilized as hard coatings had a single composition, crystalline phase, and microstructure. Some of the most common hard coatings used as thin films are diamond-like carbon (DLC), BN, B4C, SiC, Al2O3, Si3N4 and WC [1]. A growing interest in the synthesis of transition metal nitrides has risen due to their chemical inertness and high hardness to be used as wear-resistant and hard protective coatings. In particular, TiN thin films and nanocomposites using TiN satisfy these requirements and have been extensively investigated by a variety of deposition techniques in the recent literature [1], [2], [3], [4], [5]. For instance, there is a close relationship between film composition and its mechanical properties for TiN films [3]. However, there are not as many reports as expected on other transition metal nitrides.

Tungsten nitride films have generated considerable interest in the manufacturing of semiconductor devices because they are an excellent barrier for Cu diffusion into Si at high temperatures [6]. The deposition of diffusion barriers motivated the synthesis of WNx thin films by several techniques like CVD [7], [8], [9], dc reactive sputtering [10], [11], [12], [13], ALD [14], rf reactive sputtering [15], [16], ion beam sputtering [17], reactive laser ablation [18], [19] and cathodic arc [20]. There are reports concerning to the mechanical properties of alloys containing tungsten nitride sputtered coatings, like Cr–W–N [21], Ti–W–N [22] and Si–W–N [23]. WNx thin films are also a good candidate to be used as a hard coating [9], [13], [16], [19], [20]. The composition, mass density, electrical and optical properties of WNx thin films on silicon wafers at room temperature grown by reactive laser ablation have been already published by our group but the study of the mechanical properties was missing [18]. This study investigates the best possible mechanical properties as a function of film composition and microstructure for WNx coatings on stainless steel substrates synthesized by two different deposition techniques: reactive sputtering and laser ablation.

Section snippets

Experiment

As previously mentioned, the WNx thin films were grown by two different deposition methods: RPLD and dc-sputtering. The experiment was carried out in a laser ablation system described elsewhere [24]. The system consists of three UHV stainless steel chambers: sample introduction, growth and analysis, as shown in Fig. 1. The base pressure of the chambers is approximately 10−7 Pa. A KrF excimer laser is focused onto a high purity (99.9% at.) tungsten disc of 5 cm in diameter at an angle of 50° off

Results

The WNx thin films were deposited on stainless steel disks kept at 400 °C on both deposition methods. The nitrogen partial pressure was varied from 0 to 10.0 Pa in the RPLD system and from 0 to 1.6 Pa in the sputtering system. The analysis was in situ performed immediately after each deposition for the films grown by RPLD, while it was done ex situ for those grown by reactive sputtering.

The only elements present in a typical XPS spectrum of a WNx film grown by RPLD were W, N, and O. Meanwhile,

Discussion

RPLD and reactive sputtering are non-equilibrium thermodynamic processes. The different tungsten ablated species in RPLD collide with the N2 molecules in the plume expansion process and react with them, after dissociation, to form a WNx compound as a thin film on the substrate [35]. The species are released from their initial bonds in ground state in the reactive gas and free radicals, only in the ablation plume, and they rearrange themselves somewhere in the network of the growing layers

Conclusions

In summary, RPLD and reactive sputtering complement each other in the comprehension about finding the adequate processing conditions to obtain hard coatings of transition metal nitrides with optimal mechanical properties. These properties for coatings grown by both deposition techniques depend on the nitrogen content in the films, reaching a threshold value to obtain the best properties. The WNx coatings processed by reactive sputtering are superior to those synthesized by RPLD, although the

Acknowledgements

We gratefully acknowledge the technical assistance of Victor García, Pedro Casillas, Juan Antonio Peralta, Margot Sainz and Carlos González. CONACyT provided financial support.

References (37)

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