Amorphization by dislocation accumulation in shear bands
Introduction
Amorphization is a solid-state transformation that can be achieved in almost every category of crystalline materials including metal alloys [1], [2], [3], intermetallics [1], [4], [5], semiconductors [6], [7], [8], [9], [10], ceramics [11], [12], minerals [13] and very few organic compounds [14]. The crystalline to amorphous (c → a) transformation proceeds from the massive displacement of atoms into metastable positions and takes place when the crystal has reached a non-equilibrium state whose free energy is higher than that of the amorphous phase [5], [15], [16], [17]. It is sometimes associated with a shear instability [18]. It can be achieved along several processing routes such as irradiation [12], [19], interdiffusion [3], [20], [21] or dehydration [14]. It can be also activated under an indenter [7], [22], [23] or upon shock-wave loading [11] and other severe mechanical conditions such as large deformation [24], [25], mechanical alloying (MA) and mechanical milling (MM) of crystalline powders [1], [2], [5], [6], [8], [17], [26], [27]. The mechanism involved in the c → a transformation depends on the processing route. In MA, crystal destabilization is not purely a mechanical process but involves a solid-state reaction, whereas in MM, amorphization is thought to result in part from the accumulation of structural defects [17].
Whereas the nucleation of amorphization is not necessarily mediated by crystal defects as shown by Si [7], [9], [10] and B4C [11], there is repeated evidence of deformation-induced amorphous phases being nucleated at highly distorted lattice sites such as grain boundaries, twins, and dislocations [8], [22]. Grain boundaries have a substantial and even overwhelming influence as this was shown by varying the size of nanoscale grains (for reviews, see Refs. [24], [25]). The part taken by dislocations in deformation-induced amorphization is, on the other hand, rather ill-defined. In addition to being nucleation sites, dislocations are thought to favor the solid-state transformation in enhancing diffusion in the case of metal couples [28]. It has been shown that the dislocation density is dramatically increased under severe deformation conditions such as MA, where dislocations self-organize in shear bands forming cells, thus taking part in grain refinement [29], but there is no indication that the dynamical properties of dislocations such as self-organization as cells, storage or shear localization contribute directly to amorphization. The development of a dense dislocation structure during MM is sometimes reported [30] though not interpreted. In fact, transmission electron microscopy (TEM) observations have almost never been conducted at a scale adequate to pinpoint a direct relation between this and the nucleation of an amorphous phase. In the few documented instances of a c → a transformation forming amorphous layers oriented in the host crystal such as in B4C [11], dislocations were not observed and it was thus concluded that they played no role. Quartz, on the other hand, transforms differently, depending upon whether it is compressed to high pressure in which case amorphization occurs along with shear, or else shocked, in which case it does not [31]. However, amorphization seems to precede shear band formation. In effect, it is by annealing amorphous lamellae, the dominant deformation structure in naturally shocked α-quartz, that planar deformation structures including dislocation bands, Brazil-twin lamellae and transformation lamellae are generated [13], [32]. On the other hand, depending on load orientation, α-berlinite AlPO4, which is isostructural to α-quartz, deforms either by individual dislocations or by amorphous shear layers [31]. Under certain load orientations, pervasive amorphous shear lamellae are found in the weak planes of berlinite though no trace of dislocation activity is detected. In brief, while severe deformation normally involves dislocations in great numbers, no direct evidence on the role played collectively by dislocations in deformation-induced amorphization has been given and it is unclear whether there is a relation between mobile dislocation and the c → a transformation.
In this work, the defect distribution in the vicinity of indented γ-Y2Si2O7 samples was investigated by transmission electron microscopy under diffraction contrast and high-resolution imaging. γ-Y2Si2O7 is an interesting ceramic material in several respects. It is a grain boundary phase in Si3N4 ceramics doped with Y2O3 and/or SiO2 as sintering aids and, as such, it plays a beneficial role in enhancing the high-temperature mechanical properties of Si3N4 [33], [34], [35]. Y2Si2O7, which can be prepared as a single-phase bulk material [36], may be used in harsh environments under corrosive media or fast cooling/heating rates due to its good erosion resistance and low coefficient of thermal expansion [37]. With a melting point of 1775 °C, it is one of the most refractory silicates. Y2Si2O7 is therefore an excellent candidate as a high-temperature structural ceramic as well as an environmental/thermal barrier coating and oxidation protective coating on Si3N4 and SiC-based composites. The mechanical properties of Y2Si2O7 are incompletely characterized, in particular the origin of its excellent damage tolerance and good machinability is not understood [38]. In the observations reported below, we investigate the deformation microstructure under indentation and we show that amorphous layers are formed along specific crystallographic planes as a result of considerable strains highly localized in dislocation slip bands.
Section snippets
Experimental
γ-Y2Si2O7 powders were synthesized through a solid/liquid reaction method. The starting yttria and silica powders were calcined with 3 mol.% LiYO2 additive at 1400 °C for 4 h in air. Bulk polycrystalline γ-Y2Si2O7 sample was prepared by pressureless sintering of the as-synthesized γ-Y2Si2O7 powders at 1200 °C for 80 min in air. A detailed description of the synthesis process can be found in a previous publication [36]. γ-Y2Si2O7 is the high-temperature stable phase among six different polymorphs (y,
Results
Defect organization in indented γ-Y2Si2O7 was investigated at various locations relative to the indent, hence in relation with the stress applied locally. Three microstructurally distinct zones could be distinguished according to the dominating microstructural feature. Fig. 1 shows isolated dislocations populating the outer region of the indented sample at a distance of approximately 20 μm away from the indent (in a volume subjected to relatively low stresses). The deformation microstructure, as
Discussion
The similarities between the organization and properties of amorphous layers and those of slip bands in the inner and intermediate regions are striking. The morphology of the crystal cells is actually much the same whether they are delimited by slip bands in the intermediate volume or by amorphous layers in the inner region. In the latter, the two cell edges are, however, approximately 70 and 500 nm in length (Fig. 3, Fig. 5a), that is, significantly less than the cell dimensions in the
Conclusion
Extensive TEM analyses on the indented polycrystalline γ-Y2Si2O7 ceramic were conducted. The similarities between the organization and properties of amorphous layers and those of slip bands in the inner and intermediate regions, respectively, reflect the specific mechanism involved in the c → a transformation of γ-Y2Si2O7, that is, the accumulation of planar arrays of dislocations building up localized lattice distortions. How and to what extent lattice defects might contribute to the growth of
Acknowledgements
P. Veyssière wishes to thank Drs. P. Cordier, A. Finel, and Y. Le Bouar for discussions and the Hsun Lee foundation for supporting his visit at the Institute of Metal Research, Chinese Academy of Sciences. Z.J. Lin appreciates Profs. J.Y. Wang and M.S. Li for kind help. This work was supported by the National Outstanding Young Scientist Foundation for Y.C. Zhou (59925208) and Natural Sciences Foundation of China (50772114).
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Present address: LANSCE-LC MS-H805, Los Alamos National Laboratory, NM 87545, USA.