Separation of pure elemental and oxygen influenced signal in ELNES
Introduction
The fine structure of ionization edges in electron energy-loss spectrometry (EELS) yields information on the oxidation state of the probed atoms. Due to the fact that many specimens oxidize rapidly when in contact with air, one often has signals from the bulk and the oxidized surface in an EEL spectrum. When investigating ionization edge fine structures in alloys or other compounds, it is obvious that one must take into account the influence of the oxide. Furthermore, ELNES can be used to separate grain boundaries and interfaces in spatially resolved analysis [1], [2], [3], [4], [5], [6], [7], [8], [9].
The method is build on the “spatial difference method” introduced by Berger and Pennycook [10] and Bruley [11]. The main difficulty of the spatial difference method is the scaling factor to be used when subtracting the two spectra. Bruley et al. [5] suggests to normalize the spectra to the same intensity in a wide window located above the edge threshold. This can only be done if the spectra have been acquired at specimen positions of the same thicknesses because of the background signal whereas Scheu et al. [6] reports that these scaling factors can be determined by trial and error using several guidelines reported in [7], [8], [9]. All these methods are well working and important techniques for a qualitative and sometimes semi-quantitative distinction of the ELNES of the same atomic species in different chemical environments such as bulk and interface. On the other hand, they are not sufficiently reliable for an accurate determination of the ELNES, according to the uncertainty in the scaling factor.
The present method relies on experimentally determined scaling factors, allowing separation of the ELNES signal of oxidized and unoxidized material.
The basic idea, as described in Ref. [12], utilizes the fact that the detected signal is a superposition of ELNES of oxidized surface signal and unoxidized bulk signal. Therefore, two spectra with different oxygen contributions are needed. Applying the scaling factor and calculating the difference spectrum results in a spectrum containing only the bulk signal or only the surface signal. (We have chosen the expressions bulk signal and surface signal under the assumption that all oxygen is situated at the surface.) But it is irrelevant, if the oxygen, other elements, or crystal defects appear at the surface only, because the energy-loss spectrum is caused by a two-dimensional projection of ionized atoms contained in the irradiated volume, such as in solid solutions and dispersions.
Section snippets
Instrumentation and specimens
All measurements on aluminium, copper, and silicon were done at a PHILLPS CM20 UT transmission electron microscope (TEM) operated at equipped with a GATAN 666 parallel electron energy-loss spectrometer (PEELS). In the case of aluminium and silicon the largest objective aperture was chosen in order to have enough intensity in the Al-K edge and the Si-K edge. This aperture sets the collection semiangle to . In all other experiments the collection semiangle was limited to
Influence of specimen thickness
Neglect of the thickness correction factor of Eq. (2) in difference spectrum techniques has often led to large errors in the scaling factors. An explicit discussion can be found in Schattschneider et al. [12]. In this paper, we only want to present the importance of the thickness correction by means of a quantitative analysis of some features of the ELNES. The importance of the specimen thickness to the signal in the EEL spectrum is not only because of its influence on the signal background and
Results
All used spectra are zero-loss peak (ZLP) deconvolved with the EL/P feature “sharpen resolution”, background subtracted and multiple scattering deconvolved with the Fourier-ratio method.
Conclusion
When studying the fine structure of ionization edges, one must always be aware of influences caused by perturbing atoms such as surface oxygen. Consequently, changes of the energy-loss near edge structure can be found in many materials. Neglect of such influences may cause wrong results.
When using a difference spectrum technique for ELNES separation, as we suggest, one has to take into account the specimen thickness at the position of spectrum acquisition. Otherwise, the interpretation of the
Acknowledgements
We gratefully acknowledge financial support of the Austrian Science Fund contract 14038-PHY. Furthermore, support was given by the Austrian ÖAD (Amadée III.5), the French CNRS (PICS no. 913), and the “Improving Human Potential” programme of the European Commission, contract HPRI-CT-1999-00024. We thank Gilles Hug for fruitful discussions.
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