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Wakefields studies for the SXFEL user facility

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Abstract

Besides the original seeded undulator line, in the soft X-ray free-electron laser (SXFEL) user facility in Shanghai, a second undulator line based on self-amplified spontaneous emission is proposed to achieve 2-nm laser pulse with extremely high brightness. In this paper, the beam energy deviation induced by the undulator wakefields is numerically calculated, and 3D and 2D results agree well with each other. The beam energy loss along the undulator degrades the expected FEL output performances, i.e., the pulse energy, radiation power and spectrum, which can be compensated with a proper taper in the undulator. Using the planned time-resolved diagnostic, a novel experiment is proposed to measure the SXFEL longitudinal wakefields.

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Acknowledgements

The authors are grateful to Xiao Hu, Wei Zhang, Meng Zhang, Kai Li and Han Zhang for helpful discussions and useful comments.

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Authors and Affiliations

  1. Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Zhangjiang Campus, Shanghai, 201204, China

    Ming-Hao Song, Chao Feng, Da-Zhang Huang, Hai-Xiao Deng, Bo Liu & Dong Wang

  2. University of Chinese Academy of Sciences, Beijing, 100049, China

    Ming-Hao Song

Authors
  1. Ming-Hao Song
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  2. Chao Feng
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  3. Da-Zhang Huang
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  4. Hai-Xiao Deng
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  5. Bo Liu
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  6. Dong Wang
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Corresponding author

Correspondence to Hai-Xiao Deng.

Additional information

This work was supported by the National Natural Science Foundation of China (Nos. 11475250 and 11322550) and Ten Thousand Talent Program.

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Song, MH., Feng, C., Huang, DZ. et al. Wakefields studies for the SXFEL user facility. NUCL SCI TECH 28, 90 (2017). https://doi.org/10.1007/s41365-017-0242-7

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  • DOI: https://doi.org/10.1007/s41365-017-0242-7

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