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The use of advanced characterization to study transitions across solid state interfaces

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Abstract

The atomic-scale study of solid-solid interfaces in complex multi-phase multicomponent systems is a challenging but important endeavor. This article highlights the coupling of recently developed advanced characterization techniques, such as high resolution scanning transmission electron microscopy, carried out in an aberration-corrected microscope, and atom probe tomography, to address the structural and compositional transition at the atomic scale across solid-solid interfaces, such as the γ/γ′interface in nickel-base superalloys and the α/β interface in titanium alloys. Possible implications of such investigations of the interface on the understanding of physical and mechanical properties are discussed.

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Authors and Affiliations

  1. ExxonMobil Research and Engineering Company, Annandale, NJ, 08801, USA

    R. Srinivasan

  2. University of North Texas, Denton, TX, USA

    R. Banerjee, S. Nag & J. Y. Hwang

  3. Air Force Research Laboratory, Dayton, OH, USA

    G. B. Viswanathan & J. Tiley

  4. Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA

    H. L. Fraser

Authors
  1. R. Srinivasan
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  2. R. Banerjee
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  3. G. B. Viswanathan
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  4. S. Nag
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  5. J. Y. Hwang
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  6. J. Tiley
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  7. H. L. Fraser
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Correspondence to R. Srinivasan.

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Srinivasan, R., Banerjee, R., Viswanathan, G.B. et al. The use of advanced characterization to study transitions across solid state interfaces. JOM 62, 64–69 (2010). https://doi.org/10.1007/s11837-010-0183-7

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  • DOI: https://doi.org/10.1007/s11837-010-0183-7

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