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Nickel Nanoparticle-Filled High-Performance Polymeric Nanocomposites for EMI Shielding Applications

  • Progress and Challenges in Developing Electromagnetic Interference Materials
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Abstract

In this paper, the electromagnetic interference shielding effectiveness (EMI-SE) of nickel (Ni) nanoparticle-filled high-performance polyetherketone (PEK) nanocomposites produced by using planetary ball milling followed by hot pressing were studied. Field emission scanning electron microscopy showed uniform dispersion of Ni nanoparticles in the PEK matrix. The EMI-SE of the nanocomposites was measured using a vector network analyzer in the frequency range of 8.2–12.4 GHz (X-band). The obtained results indicated that the Ni/PEK nanocomposites exhibit EMI-SE of more than 25 dB. The EMI-SE behavior is superiorly stable over the X-band. The dimensional stability and the Vickers microhardness of the nanocomposites improved by approximately 22% and 42%, respectively, compared to pure PEK. These results showed that the nanocomposites might be potential candidates for EMI shielding and antistatic devices.

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Acknowledgments

The authors are thankful to M/s Gharda Chemicals Ltd., India, for donating polyetherketone powder for this research and to Mr. Suyog Gaikwad, College of Engineering Pune, India, for helping in drawing some of the figures.

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Authors and Affiliations

  1. Department of Metallurgy and Materials Science, College of Engineering Pune, Shivaji Nagar, Pune, 411008, India

    Sampada Viraj Dravid & Shubham Dinkar Bhosale

  2. Department of Applied Physics, Defence Institute of Advanced Technology, Girinagar, Pune, 411021, India

    Suwarna Datar

  3. Department of Metallurgical and Materials Engineering, Malaviya National Institute of Technology Jaipur, Malviya Nagar, Jaipur, 302017, India

    R. K. Goyal

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  1. Sampada Viraj Dravid
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  2. Shubham Dinkar Bhosale
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  4. R. K. Goyal
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Correspondence to R. K. Goyal.

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Dravid, S.V., Bhosale, S.D., Datar, S. et al. Nickel Nanoparticle-Filled High-Performance Polymeric Nanocomposites for EMI Shielding Applications. J. Electron. Mater. 49, 1630–1637 (2020). https://doi.org/10.1007/s11664-019-07535-6

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  • DOI: https://doi.org/10.1007/s11664-019-07535-6

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