Abstract
Cu-Sn solid–liquid interdiffusion (SLID) bonded joints were fabricated using a Sn-Cu solder paste and Cu for high-temperature power electronics applications. The interfacial reaction behaviors and the mechanical properties of Cu6Sn5 and Cu3Sn SLID-bonded joints were compared. The intermetallic compounds formed at the interfaces in the Cu-Sn SLID-bonded joints significantly affected the die shear strength of the joint. In terms of thermal and mechanical properties, the Cu3Sn SLID-bonded joint was superior to the conventional solder and the Cu6Sn5 SLID-bonded joints.
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M. Thoben, F. Sauerland, K. Mainka, S. Edenharter, and L. Beaurenaut, Microelectron. Reliab. 54, 1806 (2014).
Y. Wang, S. Jones, A. Dai, and G. Liu, Microelectron. Reliab. 54, 1911 (2014).
F. Dugal and M. Ciappa, Microelectron. Reliab. 54, 1856 (2014).
W. Sanfins, D. Risaletto, F. Richardeau, G. Blondel, M. Chemin, and P. Baudesson, Microelectron. Reliab. 55, 1956 (2015).
R. Singh, Microelectron. Reliab. 46, 713 (2006).
P.C. Chou, S. Cheng, and S.H. Chen, Appl. Therm. Eng. 70, 593 (2014).
R. Kisiel and Z. Szczepański, Microelectron. Reliab. 49, 627 (2009).
Z.X. Zhu, C.C. Li, L.L. Liao, C.K. Liu, and C.R. Kao, J. Alloy. Compd. 671, 340 (2016).
B.S. Lee, Y.H. Ko, J.H. Bang, C.W. Lee, S. Yoo, J.K. Kim, and J.W. Yoon, Microelectron. Reliab. 71, 119 (2017).
J.G. Bai, J.N. Calata, and G.Q. Lu, IEEE Trans. Electron. Pack. Manuf. 30, 241 (2007).
S. Wang, M. Li, H. Ji, and C. Wang, Scr. Mater. 69, 789 (2013).
K.S. Siow, J. Alloy. Compd. 514, 6 (2012).
S.Y. Zhao, X. Li, Y.H. Mei, and G.Q. Lu, J. Electron. Mater. 45, 5789 (2016).
S.W. Yoon, M.D. Glover, and K. Shiozaki, IEEE Trans. Power Electron. 28, 2448 (2013).
A.S. Khaja, C. Kaestle, A. Reinhardt, and J. Franke, in IEEE 36th International Spring Seminar on Electronics Technology, pp. 11–16 (2013).
J.F. Li, P.A. Agyakwa, and C.M. Johnson, Acta Mater. 58, 3429 (2010).
J.F. Li, P.A. Agyakwa, and C.M. Johnson, Acta Mater. 59, 1198 (2011).
J.B. Lee, H.Y. Hwang, and M.W. Rhee, J. Electron. Mater. 44, 435 (2015).
M. Fujino, H. Narusawa, Y. Kuramochi, E. Higurashi, T. Suga, T. Shiratori, and M. Mizukoshi, Jpn. J. Appl. Phys. 55, 04EC14 (2016).
T.A. Tollefsen, A. Larsson, O.M. Løvvik, and K.E. Aasmundtveit, IEEE Trans. Compon. Packag. Manuf. Technol. 3, 904 (2013).
X. Liu, S. He, and H. Nishikawa, Scr. Mater. 110, 101 (2016).
N. Saunders and A.P. Miodownik, Bull. Alloy Phase Diagr. 11, 278 (1990).
J.W. Yoon, B.I. Noh, and S.B. Jung, J. Alloy. Compd. 506, 331 (2010).
P.J. Shang, Z.Q. Liu, D.X. Li, and J.K. Shang, J. Electron. Mater. 38, 2579 (2009).
T. Laurila, V. Vuorinen, and J.K. Kivilahti, Mater. Sci. Eng. R 49, 1 (2005).
C. Yang, F. Le, and S.W.R. Lee, Microelectron. Reliab. 62, 130 (2016).
D.R. Frear, S.N. Burchett, H.S. Morgan, and J.H. Lau, eds., The Mechanics of Solder Alloy Interconnects (New York: Van Nostrand Reinhold, 1994), p. 60.
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Lee, BS., Yoon, JW. Cu-Sn Intermetallic Compound Joints for High-Temperature Power Electronics Applications. J. Electron. Mater. 47, 430–435 (2018). https://doi.org/10.1007/s11664-017-5792-2
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DOI: https://doi.org/10.1007/s11664-017-5792-2