Abstract
GaN-based visible-blind and AlGaN-based solar-blind avalanche photodiodes (APDs) have been grown and fabricated on sapphire substrates. The GaN p-i-n APDs show low dark current with high gain. The AlGaN layers for the Al0.55Ga0.45N-based APDs are grown using a newly developed pulsed metalorganic chemical vapor deposition (MOCVD) process, and the material characterization results show excellent material quality. The spectral responsivity of the devices show a bandpass characteristic with cutoffs in the ultraviolet (UV) visible-blind and solar-blind spectrum for GaN- and Al0.55Ga0.45N-based APDs, respectively.
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Suvarna, P., Tungare, M., Leathersich, J.M. et al. Design and Growth of Visible-Blind and Solar-Blind III-N APDs on Sapphire Substrates. J. Electron. Mater. 42, 854–858 (2013). https://doi.org/10.1007/s11664-013-2537-8
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DOI: https://doi.org/10.1007/s11664-013-2537-8