Larger-scale production of thermoelectric materials is necessary when mass-producing thermoelectric devices at industrial level. Certain fabrication techniques can create inhomogeneity in the material through composition and doping fluctuations throughout the sample, causing local variations in thermoelectric properties. Some variations are in the range of sub-millimeter scale or larger but may be difficult to detect by traditional materials characterization techniques such as x-ray diffraction or scanning electron microscopy when the chemical variation is small but the doping variation, which strongly affects thermoelectric performance, is large. In this paper, a scanning apparatus to directly detect local variations of Seebeck coefficient on both bulk and thin-film samples is used. Results have shown that this technique can be utilized for detection of defective regions, as well as phase separation in the 100-μm range or larger.
Similar content being viewed by others
References
S.K. Bux, R.G. Blair, P.K. Gogna, H. Lee, G. Chen, M.S. Dresselhaus, R.B. Kaner, and J.-P. Fleurial, Adv. Funct. Mater. 19, 2445 (2009).
M.S. Dresselhaus, G. Chen, M.Y. Tang, R. Yang, H. Lee, D. Wang, Z. Ren, J.-P. Fleurial, and P. Gogna, Adv. Mater. 19, 1043 (2007).
L.E. Bell, Science 321, 1457 (2008).
Y. Pei, A. LaLonde, S. Iwanaga, and G.J. Snyder, Energy Environ. Sci. 4, 2085 (2011).
D. Parker and D.J. Singh, Phys. Rev. B 82, 035204 (2010).
O. Yamashita and S. Tomiyoshi, J. Appl. Phys. 93, 368 (2003).
D. Platzek, G. Karpinski, C. Drasar, and E. Müller, Mater. Sci. Forum 587, 492 (2005).
A. Yamamoto, T. Noguchi, H. Obara, K. Ueno, S. Ikeuchi, T. Sugawara, K. Shimada, Y. Takasaki, and Y. Ishu, Mater. Res. Soc. Symp. Proc. 1024, 24 (2008).
S. Iwanaga, E.S. Toberer, A. Lalonde, and G.J. Snyder, Rev. Sci. Inst. 82, 063905 (2011).
H. Weiss, Z. Naturforsch. A 11A, 131 (1956).
N. Chen, F. Gascoin, and G.J. Snyder, Appl. Phys. Lett. 87, 171903 (2005).
R. Blachnik and R. Igel, Z. Naturforsch. B: Anorg. Chem. Org. Chem. 29, 625 (1974).
T. Ikeda, M.B. Toussaint, K. Bergum, S. Iwanaga, and G.J. Snyder, J. Mater. Sci. 46, 3846 (2011).
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Iwanaga, S., Snyder, G.J. Scanning Seebeck Coefficient Measurement System for Homogeneity Characterization of Bulk and Thin-Film Thermoelectric Materials. J. Electron. Mater. 41, 1667–1674 (2012). https://doi.org/10.1007/s11664-012-2039-0
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s11664-012-2039-0