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High-vacuum tip enhanced Raman spectroscopy

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Abstract

Tip-enhanced Raman spectroscopy (TERS) is high-sensitivity and high spatial-resolution optical analytical technique with nanoscale resolution beyond the diffraction limit. It is also one of the most recent advances in nanoscale chemical analysis. This review provides an overview of the state-of-art inTERS, in-depth information about the different available types of instruments including their (dis)advantages and capabilities. Finally, an overview about recent development in High-Vacuum TERS is given and some challenges are raised.

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Authors and Affiliations

  1. Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, P. O. Box 603-146, Beijing, 100190, China

    Zheng-Long Zhang, Li Chen, Shao-Xiang Sheng, Meng-Tao Sun & Hong-Xing Xu

  2. Department of Applied Physics, Hunan University, Changsha, 410082, China

    Li Chen & Ke-Qiu Chen

  3. School of Physics and Information Technology, Shaanxi Normal University, Xi’an, 710062, China

    Zheng-Long Zhang & Hai-Rong Zheng

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  1. Zheng-Long Zhang
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  2. Li Chen
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  4. Meng-Tao Sun
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  5. Hai-Rong Zheng
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  7. Hong-Xing Xu
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Correspondence to Meng-Tao Sun.

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These authors contributed equally to the work.

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Zhang, ZL., Chen, L., Sheng, SX. et al. High-vacuum tip enhanced Raman spectroscopy. Front. Phys. 9, 17–24 (2014). https://doi.org/10.1007/s11467-013-0364-2

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  • DOI: https://doi.org/10.1007/s11467-013-0364-2

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