Abstract
BiFeO3 film has been deposited on Pt/Ti/SiO2/Si substrate by a simple sol–gel process annealed at 500 °C. X-ray diffraction analysis revealed that the film was fully crystallized and no impure phase was observed. Cross-section scanning electric microscopy results indicated that the thickness was about 600 nm. Large remanent polarization was observed. The double remanent polarization is 95.8 μC/cm2 at an applied field of 800 kV/cm. Intense dielectric dispersion was observed above 100 kHz. At a biased electric field of 167 kV/cm, the leakage current densities were identified as ∼10−5 to 10−4 A/cm2.
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Acknowledgment
The work is supported by the Young People Program of Hubei Province Education Committee under Grant No. Q200722002.
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Liu, H., Wang, X. Large electric polarization in BiFeO3 film prepared via a simple sol–gel process. J Sol-Gel Sci Technol 47, 154–157 (2008). https://doi.org/10.1007/s10971-008-1773-5
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DOI: https://doi.org/10.1007/s10971-008-1773-5