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High-performance copper mesh for optically transparent electromagnetic interference shielding

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Abstract

A wide-spectrum high-transmittance copper mesh was designed and fabricated for effective shielding of electromagnetic waves. Using mask lithography and chemical etching, the copper mesh can be easily fabricated. The thickness of the copper mesh is uniform, whether at the crossing section and the copper wire. The average transmittance of the copper mesh from ultraviolet band to near-infrared band (200–2500 nm) is 96%, in agreement with the designed results. The electromagnetic interference shielding efficiency (EMI SE) is to 16 dB in Ku-band. The result of X-ray photoelectron spectroscopy analysis shows that a large amount of Cu2+ on the surface is reduced to Cu0 and Cu+ after annealing. As result, the EMI SE value of copper mesh has increased by 1.5 dB in Ku-band. We envision that the copper mesh can provide a good solution for optically transparent electromagnetic interference shielding.

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Acknowledgements

The authors gratefully acknowledge the financial support from the Key Industry Innovation Chain Project of Shaanxi Provincial Science and the Technology Department (2018ZDCXL-GY-08-02-01), Xi'an Key Laboratory of Intelligent Detection and Perception (201805061ZD12CG45), Dean Fund Program from School of Optoelectronic Engineering, Xi'an Technological University (2019GDYJY01) and Shaanxi International Science and Technology Cooperation and Exchange Program Project (2018KWZ-02).

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Authors and Affiliations

  1. School of Optoelectronic Engineering, Xi’an Technological University, 2 Xuefu Road, Xi’an, 710021, China

    Kai Shi, Junhong Su & Haifeng Liang

  2. Shanghai Institute of Technical Physics, Chinese Academy of Sciences, 500 Yutian Road, Shanghai, 200083, China

    Kai Hu

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Shi, K., Su, J., Hu, K. et al. High-performance copper mesh for optically transparent electromagnetic interference shielding. J Mater Sci: Mater Electron 31, 11646–11653 (2020). https://doi.org/10.1007/s10854-020-03716-w

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