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Selective SWIFT-R

A Flexible Software-Based Technique for Soft Error Mitigation in Low-Cost Embedded Systems

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Abstract

Commercial off-the-shelf microprocessors are the core of low-cost embedded systems due to their programmability and cost-effectiveness. Recent advances in electronic technologies have allowed remarkable improvements in their performance. However, they have also made microprocessors more susceptible to transient faults induced by radiation. These non-destructive events (soft errors), may cause a microprocessor to produce a wrong computation result or lose control of a system with catastrophic consequences. Therefore, soft error mitigation has become a compulsory requirement for an increasing number of applications, which operate from the space to the ground level. In this context, this paper uses the concept of selective hardening, which is aimed to design reduced-overhead and flexible mitigation techniques. Following this concept, a novel flexible version of the software-based fault recovery technique known as SWIFT-R is proposed. Our approach makes possible to select different registers subsets from the microprocessor register file to be protected on software. Thus, design space is enriched with a wide spectrum of new partially protected versions, which offer more flexibility to designers. This permits to find the best trade-offs between performance, code size, and fault coverage. Three case studies have been developed to show the applicability and flexibility of the proposal.

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Authors and Affiliations

  1. Computer Technology Department, University of Alicante, Carretera San Vicente del Raspeig s/n, 03690, Alicante, Spain

    Felipe Restrepo-Calle, Antonio Martínez-Álvarez, Sergio Cuenca-Asensi & Antonio Jimeno-Morenilla

Authors
  1. Felipe Restrepo-Calle
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  2. Antonio Martínez-Álvarez
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  3. Sergio Cuenca-Asensi
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  4. Antonio Jimeno-Morenilla
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Corresponding author

Correspondence to Felipe Restrepo-Calle.

Additional information

This work was funded by the Ministry of Science and Innovation in Spain with the project ‘RENASER+: Integral Analysis of Digital Circuits and Systems for Aerospace Applications’ (TEC2010-22095-C03-01).

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Restrepo-Calle, F., Martínez-Álvarez, A., Cuenca-Asensi, S. et al. Selective SWIFT-R. J Electron Test 29, 825–838 (2013). https://doi.org/10.1007/s10836-013-5416-6

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