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Mapping QTL for resistance to eyespot of wheat in Aegilops longissima

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Abstract

Eyespot is an economically important disease of wheat caused by the soilborne fungi Oculimacula yallundae and O. acuformis. These pathogens infect and colonize the stem base, which results in lodging of diseased plants and reduced grain yield. Disease resistant cultivars are the most desirable control method, but resistance genes are limited in the wheat gene pool. Some accessions of the wheat wild relative Aegilops longissima are resistant to eyespot, but nothing is known about the genetic control of resistance. A recombinant inbred line population was developed from the cross PI 542196 (R) × PI 330486 (S) to map the resistance genes and better understand resistance in Ae. longissima. A genetic linkage map of the Sl genome was constructed with 169 wheat microsatellite markers covering 1261.3 cM in 7 groups. F5 lines (189) were tested for reaction to O. yallundae and four QTL were detected in chromosomes 1Sl, 3Sl, 5Sl, and 7Sl. These QTL explained 44 % of the total phenotypic variation in reaction to eyespot based on GUS scores and 63 % for visual disease ratings. These results demonstrate that genetic control of O. yallundae resistance in Ae. longissima is polygenic. This is the first report of multiple QTL conferring resistance to eyespot in Ae. longissima. Markers cfd6, wmc597, wmc415, and cfd2 are tightly linked to Q.Pch.wsu-1S l, Q.Pch.wsu-3S l, Q.Pch.wsu-5S l, and Q.Pch.wsu-7S l, respectively. These markers may be useful in marker-assisted selection for transferring resistance genes to wheat to increase the effectiveness of resistance and broaden the genetic diversity of eyespot resistance.

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Acknowledgments

Plant Pathology New Series #0585, College of Agricultural, Human, and Natural Resource Sciences Agricultural Research Center Project #0670. We thank the Washington Grain Alliance for financial support of this research, the USDA National Small Grains Collection for providing seed of Ae. longissima, and the USDA-ARS Regional Small Grains Genotyping Laboratory at Pullman, WA for assistance with marker analysis.

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  1. Department of Plant Pathology, Washington State University, Pullman, WA, 99164, USA

    Hongyan Sheng & Timothy D. Murray

  2. Wheat Genetics, Quality Physiology, and Disease Research Unit, USDA-ARS, Pullman, WA, 99164, USA

    Deven R. See

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  1. Hongyan Sheng
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  2. Deven R. See
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  3. Timothy D. Murray
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Correspondence to Timothy D. Murray.

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Communicated by B. Friebe.

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Sheng, H., See, D.R. & Murray, T.D. Mapping QTL for resistance to eyespot of wheat in Aegilops longissima . Theor Appl Genet 125, 355–366 (2012). https://doi.org/10.1007/s00122-012-1838-2

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