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Measurements of the mechanical Q of single-crystal silicon at low temperatures

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Measurements of the mechanical quality factor Q in a single crystal of silicon vs. temperature have been made. A value of 2 × 109 has been measured at T = 3.5K.

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Authors and Affiliations

  1. Department of Physics and Astronomy, University of Rochester, Rochester, New York

    D. F. McGuigan, C. C. Lam, R. Q. Gram, A. W. Hoffman & D. H. Douglass

  2. Monsanto Company, St. Peters, Missouri

    H. W. Gutche

Authors
  1. D. F. McGuigan
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  2. C. C. Lam
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  3. R. Q. Gram
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  4. A. W. Hoffman
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  5. D. H. Douglass
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  6. H. W. Gutche
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Supported in part by the National Science Foundation.

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McGuigan, D.F., Lam, C.C., Gram, R.Q. et al. Measurements of the mechanical Q of single-crystal silicon at low temperatures. J Low Temp Phys 30, 621–629 (1978). https://doi.org/10.1007/BF00116202

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  • DOI: https://doi.org/10.1007/BF00116202

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