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Structure of molten silicon and germanium by X-ray diffraction

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Zeitschrift für Physik B Condensed Matter

Abstract

X-ray diffraction patterns have been obtained from molten silicon and germanium near the melting point. In both cases the structure factor was a low first peak maximum with a small hump on its high angle side in contrast with those of simple molten metals such as sodium and aluminum. It was also found that the pair correlation functions for these molten elements are characterized by a low peak maximum which follows the usual first peak maximum corresponding to the nearest neighbour distance.

The electrical resistivity and thermoelectric power have been calculated on the Ziman theory using thet-matrix of muffin-tin potential based on the structural data observed in this work. Good agreement was found in most cases.

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Authors and Affiliations

  1. The Research Institute of Mineral Dressing and Metallurgy, Tohoku University, 980, Sendai, Japan

    Y. Waseda & K. Suzuki

  2. The Research Institute for Iron, Steel and Other Metals, Tohoku University, 980, Sendai, Japan

    K. Suzuki

Authors
  1. Y. Waseda
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  2. K. Suzuki
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Waseda, Y., Suzuki, K. Structure of molten silicon and germanium by X-ray diffraction. Z Physik B 20, 339–343 (1975). https://doi.org/10.1007/BF01313204

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  • DOI: https://doi.org/10.1007/BF01313204

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