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Oxide-oxide interactions studied by transmission electron microscopy

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Abstract

The use of electron diffraction to study the interface region of thin, composite oxide films provides a sensitive means of investigating the mechanism of the solid-state reactions between these oxide layers.

An investigation of the reaction between CuO and Al2O3 and NiO and Al2O3 by this method indicates the formation of an aluminate layer by a mechanism involving cation counterdiffusion.

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Authors and Affiliations

  1. Metallurgy Department, McMaster University, Hamilton, Ontario, Canada

    R. M. Pilliar

  2. Houldsworth School of Applied Science, The University, Leeds, UK

    T. G. Carruthers & J. Nutting

Authors
  1. R. M. Pilliar
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  2. T. G. Carruthers
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  3. J. Nutting
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Pilliar, R.M., Carruthers, T.G. & Nutting, J. Oxide-oxide interactions studied by transmission electron microscopy. J Mater Sci 2, 28–32 (1967). https://doi.org/10.1007/BF00550049

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  • DOI: https://doi.org/10.1007/BF00550049

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