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Electrical Noise in Deep-Submicron CMOS

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Stochastic Process Variation in Deep-Submicron CMOS

Part of the book series: Springer Series in Advanced Microelectronics ((MICROELECTR.,volume 48))

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Abstract

In addition to device variability, which sets the limitations of circuit designs in terms of accuracy, linearity and timing, existence of electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits.

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Authors and Affiliations

  1. Electrical Engineering, Mathematics and Computer Science, Delft University of Technology, Delft, The Netherlands

    Amir Zjajo

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  1. Amir Zjajo
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Correspondence to Amir Zjajo .

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Zjajo, A. (2014). Electrical Noise in Deep-Submicron CMOS. In: Stochastic Process Variation in Deep-Submicron CMOS. Springer Series in Advanced Microelectronics, vol 48. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-7781-1_3

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  • DOI: https://doi.org/10.1007/978-94-007-7781-1_3

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  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-007-7780-4

  • Online ISBN: 978-94-007-7781-1

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