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Dynamic Force Measurements on Modified Surfaces with AFM

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Encyclopedia of Nanotechnology

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Synonyms

Amplitude-phase-distance (APD) curves; Dynamic force spectroscopy

Definition

Dynamic force measurement is a variation of the force spectroscopy mode of an Atomic Force Microscope (AFM), where the amplitude and phase response of an oscillating AFM probe are used to detect the interaction forces between the probe and the sample or substrate of interest. In contrast to quasi-static force measurements where the micro-cantilever’s deflection signal can be directly related to the interaction force between the AFM tip and sample surface using Hooke’s law, the interpretation of amplitude and phase data in dynamic force measurement often requires detailed analysis of a micro-cantilever’s vibration using dynamic models. When applied at solid/water interfaces, dynamic force measurement is sensitive to solvation forces, van der Waals forces, electric double-layer forces, and viscous damping forces. Dynamic force measurements therefore lead to a useful technique for characterizing...

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Authors and Affiliations

  1. Department of Engineering Physics, University of Wisconsin – Platteville, 1 University Plaza, Platteville, WI, 53818, USA

    Yan Wu

  2. Department of Mechanical Engineering, The Ohio State University, 201 W. 19th Avenue, Columbus, OH, 43210, USA

    Kaushik K. Rangharajan & Shaurya Prakash

Authors
  1. Yan Wu
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  2. Kaushik K. Rangharajan
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  3. Shaurya Prakash
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Corresponding author

Correspondence to Yan Wu .

Editor information

Editors and Affiliations

  1. Biomimetics (NLB²), Ohio State University Nanoprobe Lab. for Bio- & Nanotechnology, Columbus, Ohio, USA

    Bharat Bhushan

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Wu, Y., Rangharajan, K.K., Prakash, S. (2015). Dynamic Force Measurements on Modified Surfaces with AFM. In: Bhushan, B. (eds) Encyclopedia of Nanotechnology. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-6178-0_100966-1

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  • DOI: https://doi.org/10.1007/978-94-007-6178-0_100966-1

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  • Publisher Name: Springer, Dordrecht

  • Online ISBN: 978-94-007-6178-0

  • eBook Packages: Springer Reference Chemistry and Mat. ScienceReference Module Physical and Materials ScienceReference Module Chemistry, Materials and Physics

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