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From Simple Management of Defects to Knowledge Discovery to Optimize Maintenance

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Abstract

To ensure the quality of a final product, processing and traceability of defects which occur during its industrial manufacturing process has become an essential activity. Indeed, management of information relative to defects may represent up to 80% of the final product information volume. Therefore, the processing of this mass of information provides a real value-added to, for example, understand scrapping reasons, reduce or even remove this scrapping and anticipate manufacturing issues. A parallel can be drawn with software defects and the numerous follow-up systems for bugs management activities. We can name IBM Rational Clearquest

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Notes

  1. 1.

    http://www-01.ibm.com/software/awdtools/clearquest/

  2. 2.

    http://www.atlassian.com/software/jira/

  3. 3.

    http://www.mantisbt.org/

  4. 4.

    http://www.mozilla-europe.org/fr/products/bugzilla/

  5. 5.

    The founder paper introducing this algorithm was republished in an identical form 26 years later, demonstrating that it is still topical and enhancing its credibility

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Authors and Affiliations

  1. Université de Toulouse, Université Paul Sabatier, IRIT UMR 5505, 118, route de Narbonne, 31062, Toulouse cedex 9, France

    Grégory Claude & Florence Sèdes

  2. Intercim LLC, 1915 Plaza Drive, Eagan, MN, 55122, USA

    Grégory Claude & Gaël Durand

  3. Intercim, 32, rue des Jeûneurs, 75002, Paris, France

    Grégory Claude & Gaël Durand

  4. Université de Toulouse, Université Paul Sabatier, Inserm UMR 825, Place du Docteur Baylac, Pavillon Riser, 31059, Toulouse cedex 9, France

    Marc Boyer

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  1. Grégory Claude
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  2. Marc Boyer
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  3. Gaël Durand
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  4. Florence Sèdes
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Correspondence to Grégory Claude .

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Editors and Affiliations

  1. , Department of Computer Engineering, Tobb University, Sögütözü Caddesi 43, Ankara, 06560, Turkey

    Tansel Özyer

  2. , Department of Electrical Engineering, University of Western Ontario, Building 363, London, N6A 5B9, Ontario, Canada

    Keivan Kianmehr

  3. , Department of Computer Engineering, Tobb University, Söğütözü Caddesi 43, Ankara, 06560, Ankara, Turkey

    Mehmet Tan

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Claude, G., Boyer, M., Durand, G., Sèdes, F. (2012). From Simple Management of Defects to Knowledge Discovery to Optimize Maintenance. In: Özyer, T., Kianmehr, K., Tan, M. (eds) Recent Trends in Information Reuse and Integration. Springer, Vienna. https://doi.org/10.1007/978-3-7091-0738-6_6

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  • DOI: https://doi.org/10.1007/978-3-7091-0738-6_6

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