The atomic force microscope is a versatile tool increasingly used for the physical characterization of surfaces and is of great interest for the visualization and analysis of process surfaces including those of membranes used for filtration. It is capable of resolving features from the micrometer down to the subnanometer scale and can operate in air and liquid environments, allowing membranes to be studied in environments matching those encountered during their operation (Hilal et al. 2004; Hilal and Johnson 2010), which allows assessment of effects of, for instance, pH, ionic strength, and effects of additives on membrane structure, a feature not available with other high resolution imaging applications. In addition, the surface needs no special preparation, providing it remains clear of unwanted contamination, and does not need to be electrically conductive, limitations found with some imaging techniques.
The AFM consists of a sharpened probe mounted at the end of a flexible...
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Hilal, N., Johnson, D. (2016). Atomic Force Microscopy (AFM). In: Drioli, E., Giorno, L. (eds) Encyclopedia of Membranes. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-44324-8_34
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