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Determining the Dislocation Contrast Factor for X-ray Line Profile Analysis

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Diffraction Analysis of the Microstructure of Materials

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 68))

Abstract

An important step in quantifying dislocation broadening of a line profile is the evaluation of the dislocation contrast factors. In this way the elastic properties of the material, displacement field of the dislocations and geometric orientation of the diffraction vector relative to the dislocation slip-system are incorporated into the analysis.

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Authors
  1. N. Armstrong
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  2. P. Lynch
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Editor information

Editors and Affiliations

  1. Max Planck Institute for Metals Research, Heisenbergstrasse 3, 70569, Stuttgart, Germany

    Eric J. Mittemeijer

  2. Dipartimento di Ingegneria dei Materiali e Tecnologie Industriali, Università di Trento, Facoltà di Ingegneria, Via Mesiano 77, 38050, Mesiano, Italy

    Paolo Scardi

Additional information

Dedicated to Professor R.W. Cheary for teaching and inspiring us to tackle this problem

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© 2004 Springer-Verlag Berlin Heidelberg

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Armstrong, N., Lynch, P. (2004). Determining the Dislocation Contrast Factor for X-ray Line Profile Analysis. In: Mittemeijer, E.J., Scardi, P. (eds) Diffraction Analysis of the Microstructure of Materials. Springer Series in Materials Science, vol 68. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-06723-9_10

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  • DOI: https://doi.org/10.1007/978-3-662-06723-9_10

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-07352-6

  • Online ISBN: 978-3-662-06723-9

  • eBook Packages: Springer Book Archive

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