Abstract
The optical characterisation of nanostructured noble metal films is discussed. A good description of the optical response of a 2D layer of identical metal particles on a support is obtained with the so-called Thin Island Film theory, which is based on the polarisability of an individual nanoparticle. The influence of particle shape, density, and the optical properties of both the support and the surrounding ambient is discussed as well as the ability of the commonly used Maxwell Garnett approximation to model these films. The possibilities and limits of this approach is illustrated with several examples. A short outlook towards the ellipsometric analysis of metamaterials is given.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Similar content being viewed by others
References
J.C.M. Garnett, Phil. Trans. Roy. Soc. Lond. 203A, 385 (1904)
J.C.M. Garnett, Phil. Trans. Roy. Soc. Lond. ibid 205A, 237 (1906)
O.S. Heavens, Optical properties of thin films. Rep. Prog. Phys. 23, 2–65 (1960)
D.A.G. Bruggeman, Ann. Phys. (Leipzig) 24, 636 (1935)
D.E. Aspnes, Am. J. Phys. 50, 704 (1982)
H. Fujiwara, Spectroscopic Ellipsometry (Wiley, Hoboken, 2007)
E.S. Kooij, H. Wormeester, E.A.M. Brouwer, E. van Vroonhoven, A. van Silfhout, B. Poelsema, Langmuir 18, 4401 (2002)
G. Mie, On the optics of turbid media, especially colloidal metal solutions. Ann. Phys. -Berlin 25, 377–445 (1908)
U. Kreibig, M. Vollmer, Optical Properties of Metal Clusters (Springer, New York, 1995)
T.W.H. Oates, H. Wormeester, H. Arwin, Prog. Surf. Sci. 86, 328 (2011)
H. Wormeester, E.S. Kooij, B. Poelsema, Phys. Stat. Sol. A 205, 756 (2008)
S. Yamaguchi, J. Phys. Soc. Jpn. 15, 1577 (1960)
A. Hilger, M. Tenfelde, U. Kreibig, Appl. Phys. B 73, 361 (2001)
A. Rijn van Alkemade, Ph.D. thesis, University of Leiden, 1881.
J. Lekner, Theory of Reflection (Martinus Nijhof Publishers, Dordrecht, 1987)
T. Yamaguchi, S. Yoshida, A. Kinbara, Thin Solid Films 21, 173 (1973)
D. Bedeaux, J. Vlieger, Phys. A 67, 55 (1973)
D. Bedeaux, J. Vlieger, Optical Properties of surfaces (Imperial College Press, London, 2002)
M.T. Haarmans, D. Bedeaux, Thin Solid Films 224, 117 (1993)
H. Wormeester, A.I. Henry, E.S. Kooij, B. Poelsema, M.P. Pileni, J. Chem. Phys. 124, 204713 (2006)
R. Lazzari, I. Simonsen, Thin Solid Films 419, 124 (2002)
R.G. Barrera, M. Delcastillomussot, G. Monsivais, P. Villasenor, W.L. Mochan, Phys. Rev. B 43, 13819 (1991)
M.R. Bohmer, E.A. van der Zeeuw, G.J.M. Koper, J. Colloid Interface Sci. 197, 242 (1998)
T.W.H. Oates, A Mucklich. Nanotechnology 16, 2606–2611 (2005)
H. Arwin, D.E. Aspnes, Thin Solid Films 113, 101 (1984)
A.J. de Vries, E.S. Kooij, H. Wormeester, A.A. Mewe, B. Poelsema, J. Appl. Phys. 101, 053703 (2007)
T.W.H. Oates, M. Ranjan et al., Highly anisotropic effective dielectric functions of silver nanoparticle arrays. Opt. Express 19(3), 2014–2028 (2011)
J. Yao, Z.W. Liu et al., Optical negative refraction in bulk metamaterials of nanowires. Science 321(5891), 930–930 (2008)
Y.J. Jen, A. Lakhtakia et al., Vapor-deposited thin films with negative real refractive index in the visible regime. Opt. Express 17(10), 7784–7789 (2009)
J.B. Pendry, A.J. Holden et al., Low frequency plasmons in thin-wire structures. J. Phys. Condens. Matter 10(22), 4785–4809 (1998)
T.W.H. Oates, A. Keller et al., Aligned silver nanoparticles on rippled silicon templates exhibiting anisotropic plasmon absorption. Plasmonics 2(2), 47–50 (2007)
T.W.H. Oates, A. Keller et al., Self-organized metallic nanoparticle and nanowire arrays from ion-sputtered silicon templates. Appl. Phys. Lett. 93(6), 3 (2008)
M. Silveirinha, N. Engheta, Tunneling of electromagnetic energy through subwavelength channels and bends using epsilon-near-zero materials. Phys. Rev. Lett. 97(15) (2006).
J.B. Pendry, A.J. Holden et al., Magnetism from conductors and enhanced nonlinear phenomena. IEEE Trans. Microw. Theory Tech. 47(11), 2075–2084 (1999)
D.R. Smith, W.J. Padilla et al., Composite medium with simultaneously negative permeability and permittivity. Phys. Rev. Lett. 84(18), 4184–4187 (2000)
T.J. Yen, W.J. Padilla et al., Terahertz magnetic response from artificial materials. Science 303(5663), 1494–1496 (2004)
G. Dolling, M. Wegener et al., Negative-index metamaterial at 780 nm wavelength. Opt. Lett. 32(1), 53–55 (2007)
V.M. Agranovich, Y.N. Gartstein, Spatial dispersion and negative refraction of light. Phys. Usp. 49(10), 1029–1044 (2006)
S. Tretyakov, I. Nefedov et al., Waves and energy in chiral nihility. J. Electromagn. Waves Appl. 17(5), 695–706 (2003)
L.D. Landau, L.P. Lifshitz, Electrodynamics of Continuous Media (Pergamon Press, Oxford, 1984)
B. Gompf, J. Braun et al., Periodic nanostructures: spatial dispersion mimics chirality. Phys. Rev. Lett. 106, 185501 (2011)
R. Ossikovski, M. Anastasiadou et al., Depolarizing Mueller matrices: how to decompose them? Phys. Stat. Sol. A 205, 720 (2008)
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Appendices
Appendix
Lorentzian Line Shape for the Polarizability in the Dipole Approximation
The polarizability of a particle with radius a and screening parameter k to incorporate shape effects is:
Inserting the Drude dielectric function:
This is a Lorentzian line shape with the same broadening \(\Gamma \) as the Drude lineshape and with
Lorentzian Line Shape in the Maxwell Garnett Approach
The Maxwell Garnett approach provides an effective dielectric function according to:
For a Drude metal particle this leads to:
which is a Lorentzian line shape with
The width \(\Gamma \) of the Lorentzian is the same as the original Drude broadening. The enumerator \(\mathrm{{E}}_{\text{ p,MG}}^2\) in the last term of Eq. 6.14 can be rewritten
Lorentzian Line Shape in the TIF Approach
The derivation of the dimensionless polarizability lineshape for a Drude metal is very similar to A1:
This is again a Lorentzian line shape with the same broadening \(\Gamma \) as the Drude lineshape and with as for the polarizability
The parallel component of the dielectric function is thus (Eq. 6.6):
with
The resonance energy \(\mathrm{{E}}_{0,{\text{ dip}}}\) in the dipolar approximation of the TIF model looks at first the same as that of the isolated particles. However, do note that the screening factor k not only includes shape effects, but also image and neighbour interaction effects.
Quadrupole Expression for the Excess Polarizability
Haarmans and Bedeaux [18] derived an explicit form for the expression up to quadrupole order for excess surface polarizability \(\upgamma \) and \(\upbeta \):
Here, \(L_\mathrm{{p}} \) and \(L_\text{ z} \) represent the dipolar correction terms and \(L1_{\mathrm{{p}}}\) and \(L1_{\mathrm{{z}}}\), \(\Lambda _{\mathrm{{p}}}\) and \(\Lambda _{\mathrm{{z}}}\) are the quadrupole depolarization factors.
The image effect is modulated by the factor \(\mathrm{{B}}_{\mathrm{{sa}}}\) that describes the contrast between ambient and substrate:
This contrast is quite considerable for semiconductors and metals \((\mathrm{{B}}_{\mathrm{{sa}}} {\approx }-1)\), while it is quite reduced for dielectrics. For instance for a glass substrate in a water ambient, \(\mathrm{{B}}_{\mathrm{{sa}}}\) and thus the image effect, is reduced by an order of magnitude.
The dipolar and quadrupole depolarization factors as a function of surface coverage are:
The factors \(\Lambda _{\mathrm{{p}}}\) and \(\Lambda _{\mathrm{{z}}}\) are quite small and are only present if image effects play a role. Very often, \(\Lambda _{\mathrm{{p}}}\) and \(\Lambda _{\mathrm{{z}}} << 1\) in a coverage range up to 50 %. In this case the quadrupole contribution vanishes, and only the dipole contribution remains. Note that as a results of the image effect the sum of the depolarization factors
no longer equals 1. This rule is broken as a result of the image effect.
Rights and permissions
Copyright information
© 2013 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Wormeester, H., Oates, T.W.H. (2013). Thin Films of Nanostructured Noble Metals. In: Losurdo, M., Hingerl, K. (eds) Ellipsometry at the Nanoscale. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-33956-1_6
Download citation
DOI: https://doi.org/10.1007/978-3-642-33956-1_6
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-33955-4
Online ISBN: 978-3-642-33956-1
eBook Packages: EngineeringEngineering (R0)