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  • Conference proceedings
  • © 1990

Photoacoustic and Photothermal Phenomena II

Proceedings of the 6th International Topical Meeting, Baltimore, Maryland, July 31–August 3, 1989

Editors:

  1. John C. Murphy

    1. Materials Science Department and Applied Physics Laboratory, The Johns Hopkins University, Laurel, USA

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  2. Jane W. Maclachlan Spicer

    1. Applied Physics Laboratory, The Johns Hopkins University, Laurel, USA

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    You can also search for this editor in PubMed   Google Scholar

  3. Leonard C. Aamodt

    1. Applied Physics Laboratory, The Johns Hopkins University, Laurel, USA

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  4. Barrie S. H. Royce

    1. School of Engineering and Applied Science, Department of Mechanical and Aerospace Engineering, Princeton University, Princeton, USA

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Part of the book series: Springer Series in Optical Sciences (SSOS, volume 62)

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Table of contents (139 papers)

  1. Front Matter

    Pages I-XXI
    PDF

  2. Imaging and Characterization

    1. Front Matter

      Pages 1-1
      PDF

    2. Photothermal Imaging Using Microwave Detection

      • J. Pelzl, U. Netzelmann, Th. Orth, R. Kordecki
      Pages 2-12

    4. Photothermal Imaging of Local Thermal Resistances

      • M. Beyfuss, J. Baumann, R. Tilgner
      Pages 17-20

    5. Detection of Vertical Cracks in Ceramic Materials by the Mirage Effect

      • J. Rantala, J. Hartikainen, R. Lehtiniemi, R. Vuohelainen, M. Oksanen, J. Jaarinen et al.
      Pages 21-23

    6. A Novel “Flying-Spot” Infrared Camera for Imaging Very Fast Thermal-Wave Phenomena

      • Y. Q. Wang, P. K. Kuo, L. D. Favro, R. L. Thomas
      Pages 24-26

    8. Real-Time Thermal-Wave Imaging of Plasma-Sprayed Coatings and Adhesive Bonds Using a Box-Car Video Technique

      • T. Ahmed, H. J. Jin, P. Chen, P. K. Kuo, L. D. Favro, R. L. Thomas
      Pages 30-32

    10. Characterization of Metal Defects in Insulating Materials

      • X. M. Teng, L. J. Inglehart
      Pages 37-39

    11. Thermal Wave Characterization of Ceramics

      • L. J. Inglehart
      Pages 40-43

  3. Nondestructive Evaluation and Layered Systems

    1. Front Matter

      Pages 45-45
      PDF

    2. Time-Domain Opto-thermal Spectro-radiometry

      • R. E. Imhof, C. J. Whitters, D. J. S. Birch
      Pages 46-54

    3. Time-Resolved Infrared Radiometry for Characterization of Structured Materials

      • J. W. Maclachlan Spicer, W. D. Kerns, L. C. Aamodt, J. C. Murphy
      Pages 55-58

    6. Depth Profiling of Opaque Multilayer Materials by Correlation Photoacoustics

      • S. Y. Zhang, Q. Shen, B. Yan, Z. Q. Wang, Y. C. Shen
      Pages 67-70
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About this book

Photothermal science continues to be an area of rapid development and active investigation, as is demonstrated by this volume. The various contributions present fundamental research in materials science, physics, chemistry, biology, and medicine, as well as important applications of photothermal techniques in nondestructive evaluation, aeronomy and pollution control, and other areas. The topics treated include measurements of spectral properties of gases, the theory of thermally generated elastic waves, a method of monitoring local surface displacements, materials characterization and nondestructive evaluation of materials, studies of the dynamics of primary photophysical processes, fast energy exchange at surfaces and at interfaces (e.g. in medicine and photobiology), thermal EXAFS and XANES applied to metals and semiconductors, and imaging of magnetic materials using microwave sources.
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Keywords

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Editors and Affiliations

  • Materials Science Department and Applied Physics Laboratory, The Johns Hopkins University, Laurel, USA

    John C. Murphy

  • Applied Physics Laboratory, The Johns Hopkins University, Laurel, USA

    Jane W. Maclachlan Spicer, Leonard C. Aamodt

  • School of Engineering and Applied Science, Department of Mechanical and Aerospace Engineering, Princeton University, Princeton, USA

    Barrie S. H. Royce

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Bibliographic Information

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Access via your institution

Buy it now

eBook USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access

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