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Learning Statistical Structure for Object Detection

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Computer Analysis of Images and Patterns (CAIP 2003)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 2756))

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Abstract

Many classes of images exhibit sparse structuring of statistical dependency. Each variable has strong statistical dependency with a small number of other variables and negligible dependency with the remaining ones. Such structuring makes it possible to construct a powerful classifier by only representing the stronger dependencies among the variables. In particular, a semi-naïve Bayes classifier compactly represents sparseness. A semi-naïve Bayes classifier decomposes the input variables into subsets and represents statistical dependency within each subset, while treating the subsets as statistically independent. However, learning the structure of a semi-naïve Bayes classifier is known to be NP complete. The high dimensionality of images makes statistical structure learning especially challenging. This paper describes an algorithm that searches for the structure of a semi-naïve Bayes classifier in this large space of possible structures. The algorithm seeks to optimize two cost functions: a localized error in the log-likelihood ratio function to restrict the structure and a global classification error to choose the final structure. We use this approach to train detectors for several objects including faces, eyes, ears, telephones, push-carts, and door-handles. These detectors perform robustly with a high detection rate and low false alarm rate in unconstrained settings over a wide range of variation in background scenery and lighting.

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References

  1. Schneiderman, H., Kanade, T.: Object Detection using the Statistics of Parts. To appear in International Journal of Computer Vision (2003)

    Google Scholar 

  2. Rowley, H.A., Baluja, S., Kanade, T.: Neural Network-Based Face Detection. IEEE Transactions on Pattern Analysis and Machine Intelligence 20(1), 23–38 (1998)

    Article  Google Scholar 

  3. Moghaddam, B., Pentland, A.: Probabilistic visual learning for object representation. IEEE Transactions on Pattern Analysis and Machine Intelligence 19(7), 696–710 (1997)

    Article  Google Scholar 

  4. Heisele, B., Serre, T., Pontil, M., Poggio, T.: Component Based Face Detection. In: CVPR 2001 (2001)

    Google Scholar 

  5. Viola, P., Jones, M.: Rapid Object Detection Using a Boosted Cascade of Simple Features. In: CVPR 2001 (2001)

    Google Scholar 

  6. Kononenko, I.: Semi-Naïve Bayesian Classifier. In: Sixth European Working Session on Learning, pp. 206–219 (1991)

    Google Scholar 

  7. Domingos, P., Pazzani, M.: On the Optimality of the Simple Bayesian Classifier under Zero-One Loss. Machine Learning 29, 103–130 (1997)

    Article  MATH  Google Scholar 

  8. Rokach, L., Maimon, O.: Theory and Applications of Attribute Decomposition. In: IEEE International Conference on Data Mining, pp. 473–480 (2001)

    Google Scholar 

  9. Cooper, G., Herskovits, E.: A Bayesian Method for the Induction of Probabilistic Networks from Data. Machine Learning 9, 303–347 (1992)

    Google Scholar 

  10. Sung, K.-K., Poggio, T.: Example-Based Learning for View-Based Human Face Detection. IEEE Transactions on Pattern Analysis and Machine Intelligence 20(1), 39–51 (1998)

    Article  Google Scholar 

  11. Roth, D., Yang, M.-H., Ahuja, N.: A SNoW-Based Face Detector. In: NPPS-12 (1999)

    Google Scholar 

  12. Schneiderman, H.: CMU Robotics Institute Tech Report (in Preparation)

    Google Scholar 

  13. Duda, R.O., Hart, P.E., Stork, D.G.: Pattern Classification. John Wiley & Sons, Chichester (2001)

    MATH  Google Scholar 

  14. Heckerman, D., Geiger, D., Chickering, D.H.: Learning Bayesian Networks: The Combination of Knowledge and Statistical Data. Machine Learning 20(3), 197–243 (1995)

    MATH  Google Scholar 

  15. Friedman, N., Koller, D.: Being Bayesian about Network Structure: A Bayesian Approach to Structure Discovery in Bayesian Networks. Machine Learning Journal (2002)

    Google Scholar 

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© 2003 Springer-Verlag Berlin Heidelberg

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Schneiderman, H. (2003). Learning Statistical Structure for Object Detection. In: Petkov, N., Westenberg, M.A. (eds) Computer Analysis of Images and Patterns. CAIP 2003. Lecture Notes in Computer Science, vol 2756. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-45179-2_54

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  • DOI: https://doi.org/10.1007/978-3-540-45179-2_54

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-40730-0

  • Online ISBN: 978-3-540-45179-2

  • eBook Packages: Springer Book Archive

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