Abstract
The impact of Ga+-focused ion beam (FIB) about functional properties of continuous and nanostructured piezoelectric thin films of lead zirconate titanate (Pb(ZrxTi1-x)O3) was investigated. A suitable way to fabricate piezoelectric nanocapacitors was studied, based on the amorphous or crystallized state of the film before etching. Strong modification of structural and electrical behavior for area exposed to ion irradiation is observed when the film is etched in the crystallized state. Both the implantation of Ga+ ions and the film amorphization highlighted by Raman spectroscopy and Kelvin force microscopy analyses can explain this result. The piezoactivity detected by piezoresponse force microscopy is fully destroyed even after a post-annealing treatment. In the case of amorphous etched film, no significant degradation is observed. The latter process is used to successfully fabricate Pb(ZrxTi1-x)O3-based nanocapacitors by means of FIB method. In 50-nm-size capacitors, the local electromechanical behavior is measured at similar level that the one obtained for the un-etched film, evidencing no manifest sidewall effect or FIB-induced damages. This further evidences that amorphous FIB lithography process can reduce the etching damages, demonstrating this is an effective alternative method and very beneficial to pattern such low-dimensional structures, which is a significant result in view of the development of functional nanostructures in the field of nanoelectromechanical systems applications.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsReferences
He, R.R., Feng, X.L., Roukes, M.L., et al.: Self-transducing silicon nanowire electromechanical systems at room temperature. Nano Lett. 8, 1756–1761 (2008)
Bhaskaran, M., Sriram, S., Ruffell, S., et al.: Nanoscale characterization of energy generation from piezoelectric thin films. Adv. Funct. Mater. 21, 2251–2257 (2011)
Wang, Z.L., Song, J.: Piezoelectric nanogenerators based on zinc oxide nanowire arrays. Science 312, 242–246 (2006)
Trolier-McKinstry, S., Muralt, P.: Thin film piezoelectrics for MEMS. J. Electroceram. 12, 7–17 (2004)
Eom, C.B., Trolier-McKinstry, S.: Thin-film piezoelectric MEMS. MRS Bull. 37, 1007–1021 (2012)
Evans, P.R., Zhu, X., Baxter, P., et al.: Toward self-assembled ferroelectric random access memories: hard-wired switching capacitor arrays with almost Tb/in.2 densities. Nano Lett. 7, 1134–1137 (2007)
Xu, S., Hansen, B.J., Wang, Z.L.: Piezoelectric-nanowire-enabled power source for driving wireless microelectronics. Nat. Commun. 1, 93 (2010)
Lee, W., Han, H., Lotnyk, A., et al.: Individually addressable epitaxial ferroelectric nanocapacitor arrays with near Tb inch-2 density. Nat. Nanotechnol. 3, 402–407 (2008)
Ahn, C.H., Rabe, K.M., Triscone, J.M.: Ferroelectricity at the nanoscale: local polarization in oxide thin films and heterostructures. Science 303, 488–491 (2004)
Gruverman, A., Kholkin, A.: Nanoscale ferroelectrics: processing, characterization and future trends. Rep. Prog. Phys. 69, 2443–2474 (2006)
Han, H., Kim, Y., Alexe, M., et al.: Nanostructured ferroelectrics: fabrication and structure-property relations. Adv. Mater. 23, 4599–4613 (2011)
Nagarajan, V., Roytburd, A., Stanishevsky, A., et al.: Dynamics of ferroelastic domains in ferroelectric thin films. Nat. Mater. 2, 43–47 (2003)
Scott, J.F.: Dimensional effects on ferroelectrics: ultra-thin single crystals, nanotubes, nano-rods, and nano-ribbons. Ferroelectr 316, 13–21 (2005)
Morozovska, A.N., Eliseev, E.A., Glinchuk, M.D.: Ferroelectricity enhancement in confined nanorods: direct variational method. Phys. Rev. B 73, 214106 (2006)
Mancha, S.: Chemical etching of thin-film PLZT. Ferroelectr 135, 131–137 (1992)
Kawagughi, T., Adachi, H., Setsune, K., et al.: PLZT thin-film waveguides. Appl. Opt. 23, 2187–2191 (1984)
Legrand, C., Da Costa, A., Desfeux, R., et al.: Piezoelectric evaluation of ion beam etched Pb(Zr, Ti)O3 thin films by piezoresponse force microscopy. Appl. Surf. Sci. 253, 4942–4946 (2007)
Saito, K., Choi, J.H., Fukuda, T., et al.: Reactive ion etching of sputtered PbZr1-xTixO3 thin-films. Jpn. J. Appl. Phys. Pt. 2 31, L1260–L1262 (1992)
Blach-Legrand, C., Saitzek, S., Da Costa, A., et al.: Comparative analysis for the local piezoelectric properties of ion beam and reactive ion beam etched Pb(Zr, Ti)O3 thin films. Integr. Ferroelectr. 98, 230–240 (2008)
Yokoyama, S., Ito, Y., Ishihara, K., et al.: High-temperature etching of PZT/PT/TIN structure by high-density ECR plasma. Jpn. J. Appl. Phys. Pt. 1 34, 767–770 (1995)
Chung, C.W., Kim, C.J.: Etching effects on ferroelectric capacitors with multilayered electrodes. Jpn. J. Appl. Phys. Pt. 1 36, 2747–2753 (1997)
Ganpule, C.S., Stanishevsky, A., Su, Q., et al.: Scaling of ferroelectric properties in thin films. Appl. Phys. Lett. 75, 409–411 (1999)
Ganpule, C.S., Stanishevsky, A., Aggarwal, S., et al.: Scaling of ferroelectric and piezoelectric properties in Pt/SrBi2Ta2O9/Pt thin films. Appl. Phys. Lett. 75, 3874–3876 (1999)
Schilling, A., Byrne, D., Catalan, G., et al.: Domains in ferroelectric nanodots. Nano Lett. 9, 3359–3364 (2009)
Liang, R.H., Rémiens, D., Deresmes, D., et al.: Enhancement in nanoscale electrical properties of lead zirconic titanate island fabricated by focused ion beam. J. Appl. Phys. 105, 044101–044107 (2009)
Rémiens, D., Liang, R.H., Soyer, C., et al.: Analysis of the degradation induced by focused ion Ga3+ beam for the realization of piezoelectric nanostructures. J. Appl. Phys. 108:042008–6 (2010).
Roytburd, A.L., Alpay, S.P., Nagarajan, V., et al.: Measurement of internal stresses via the polarization in epitaxial ferroelectric films. Phys. Rev. Lett. 85, 190–193 (2000)
Li, J.H., Chen, L., Nagarajan, V., et al.: Finite element modeling of piezoresponse in nanostructured ferroelectric films. Appl. Phys. Lett. 84, 2626–2628 (2004)
Stanishevsky, A., Nagaraj, B., Melngailis, J., et al.: Radiation damage and its recovery in focused ion beam fabricated ferroelectric capacitors. J. Appl. Phys. 92, 3275–3278 (2002)
Tiedke, S., Schmitz, T., Prume, K., et al.: Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope. Appl. Phys. Lett. 79, 3678–3680 (2001)
Schilling, A., Adams, T., Bowman, R.M., et al.: Strategies for gallium removal after focused ion beam patterning of ferroelectric oxide nanostructures. Nanotechnology 18, 035301 (2007)
Hambe, M., Wicks, S., Gregg, J.M., et al.: Creation of damage-free ferroelectric nanostructures via focused ion beam milling. Nanotechnology 19, 175302 (2008)
Morelli, A., Johann, F., Schammelt, N., et al.: Ferroelectric nanostructures fabricated by focused-ion-beam milling in epitaxial BiFeO3 thin films. Nanotechnology 22, 265303 (2011)
Rémiens, D., Soyer, C., Troadec, D., et al.: Integration and optimisation of PZT piezoelectric thin films in micro and nano dimensional structures. Micro. Nanosyst. 1, 214–225 (2009)
Gatoux, A., Ferri, A., Detalle, M., et al.: Characterizing nanoscale electromechanical fatigue in Pb(Mg1/3Nb2/3)O3-PbTiO3 thin films by piezoresponse force microscopy. Thin Solid Films 520, 591–594 (2011)
Detalle, M., Wang, G., Rémiens, D., et al.: Comparison of structural and electrical properties of PMN-PT films deposited on Si with different bottom electrodes. J. Cryst. Growth 305, 137–143 (2007)
Herdier, R., Detalle, M., Jenkins, D., et al.: Piezoelectric thin films for MEMS applications-A comparative study of PZT, 0.7PMN-0.3PT and 0.9PMN-0.1PT thin films grown on Si by r.f. magnetron sputtering. Sens. Actuators. A. Phys. 148, 122–128 (2008)
Gruverman, A., Auciello, O., Tokumoto, H.: Imaging and control of domain structures in ferroelectric thin films via scanning force microscopy. Annu. Rev. Mater. Sci. 28, 101–123 (1998)
Alexe, M., Gruverman, A. (eds.): Nanoscale Characterisation of Ferroelectric Materials – Scanning Probe Microscopy Approach. Springer, Berlin (2004)
Balke, N., Bidkin, N., Kalinin, S.V., et al.: Electromechanical imaging and spectroscopy of ferroelectric and piezoelectric materials: state of the art and prospects for the future. J. Am. Ceram. Soc. 92, 1629–1647 (2009)
Soergel, E.: Piezoresponse force microscopy (PFM). J. Phys. D: App. Phys. 44, 46400–46417 (2011)
Ferri, A., Da Costa, A., Desfeux, R., et al.: Nanoscale investigations of electrical properties in relaxor Pb(Mg1/3Nb2/3)O3-PbTiO3 thin films deposited on platinum and LaNiO3 electrodes by means of local piezoelectric response. Integr. Ferroelectr. 91, 80–96 (2007)
Desfeux, R., Ferri, A., Legrand, C., et al.: Nanoscale investigations of switching properties and piezoelectric activity in ferroelectric thin films using piezoresponse force microscopy. Int. J. Nanotechnol. 5, 827–837 (2008)
Ziegler, J.F. (ed.): The Stopping and Range of Ions in Solids. Pergamon, New York (1985)
Meng, J.F., Katiyar, R.S., Zou, G.T., et al.: Raman phonon modes and ferroelectric phase transitions in nanocrystalline lead zirconate titanate. Phys. Status Solidi A 164, 851–862 (1997)
Lou, X., Hu, X., Zhang, M., et al.: Phase separation in lead zirconate titanate and bismuth titanate during electrical shorting and fatigue. J. Appl. Phys. 99, 044101–044107 (2006)
Frantti, J., Lantto, V., Nishio, S., et al.: Effect of A- and B-cation substitutions on the phase stability of PbTiO3 ceramics. Phys. Rev. B 59, 12–15 (1999)
Nomura, K., Takeda, Y., Maeda, M., et al.: In situ observation of the crystallization process of ferroelectric thin films by Raman microspectroscopy. Jpn. J. Appl. Phys. Pt. 1 39, 5247–5251 (2000)
Kang, M.G., Kim, K.T., Kim, C.I.: Plasma-induced damage in PZT thin films etched by inductively coupled plasma. Thin Solid Films 435, 222–226 (2003)
Soyer, C., Cattan, E., Rémiens, D.: Ion beam etching of lead–zirconate–titanate thin films: correlation between etching parameters and electrical properties evolution. J. Appl. Phys. 92, 1048–1055 (2002)
Acknowledgments
This work was partially supported by the postdoctoral project provided by the French Minister for Research and New Technologies. The authors want to thank the Université de Valenciennes et du Hainaut Cambrésis and the Université d’Artois. The authors gratefully acknowledge Dr. J. F. Blach, Dr. R. H. Liang, Dr. C. Soyer, and Dr. S. Quignon for the collaboration in this work. The authors also wish to thank L. Maës for technical support.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2013 Springer International Publishing Switzerland
About this chapter
Cite this chapter
Ferri, A., Rémiens, D., Desfeux, R., Da Costa, A., Deresmes, D., Troadec, D. (2013). Evaluation of Damages Induced by Ga+-Focused Ion Beam in Piezoelectric Nanostructures. In: Wang, Z. (eds) FIB Nanostructures. Lecture Notes in Nanoscale Science and Technology, vol 20. Springer, Cham. https://doi.org/10.1007/978-3-319-02874-3_17
Download citation
DOI: https://doi.org/10.1007/978-3-319-02874-3_17
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-02873-6
Online ISBN: 978-3-319-02874-3
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)