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Using an SMT Solver for Checking the Completeness of FSM-Based Tests

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Abstract

Deriving tests with guaranteed fault coverage by FSM-based test methods is rather complex for systems with a large number of states. At the same time, formal verification methods allow to effectively process large transition systems; in particular, SMT solvers are widely used to solve analysis problems for finite transition systems. In this paper, we describe the known necessary and sufficient conditions of completeness of test suites derived by FSM-based test methods via the first-order logic formulas and use an SMT solver in order to check them. In addition, we suggest a new sufficient condition for test suite completeness and check the corresponding first-order logic formula via the SMT solver. The results of computer experiments with randomly generated finite state machines confirm the correctness and efficiency of a proposed approach.

This work is partly supported by RFBR project No 18-01-00854.

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References

  1. Test generation for finite state machine. http://www.fsmtestonline.ru/

  2. Chow, T.S.: Test design modeled by finite-state machines. IEEE Trans. SE 4(3), 178–187 (1978)

    Article  Google Scholar 

  3. Dorofeeva, R., El-Fakih, K., Yevtushenko, N.: An improved conformance testing method. In: Wang, F. (ed.) FORTE 2005. LNCS, vol. 3731, pp. 204–218. Springer, Heidelberg (2005). https://doi.org/10.1007/11562436_16

    Chapter  Google Scholar 

  4. Fujiwara, S., Bochmann, G., Khendek, F., Amalou, M., Ghedamsi, A.: Test selection based on finite state models. IEEE Trans. Softw. Eng. 17, 591–603 (1991). https://doi.org/10.1109/32.87284

    Article  Google Scholar 

  5. Gill, A.: Introduction to the Theory of Finite-State Machines. McGraw-Hill, New York (1962)

    MATH  Google Scholar 

  6. Huth, M., Ryan, M.: Logic in Computer Science: Modelling and Reasoning About Systems. Cambridge University Press, Cambridge (2004)

    Book  Google Scholar 

  7. Koufareva, I., Dorofeeva, M.: A novel modification of W-method. Joint Bull. Novosibirsk Comput. 18, 69–81 (2002)

    Google Scholar 

  8. Laputenko, A., Vinarskii, E.: Python scripts for z3 solver (2020). https://github.com/vinevg1996/ictss_2020

  9. Petrenko, A., Yevtushenko, N., Lebedev, A., Das, A.: Nondeterministic state machines in protocol conformance testing, pp. 363–378 (1993)

    Google Scholar 

  10. Vasilevskii, M.P.: Failure diagnosis of automata, pp. 98–108. No. 4 (1973)

    Google Scholar 

  11. Yevtushenko, N., Petrenko, A.: Failure diagnosis of automata. No. 5 (1990)

    Google Scholar 

  12. Yurichev, D.: SAT/SMT by Example (2020)

    Google Scholar 

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Correspondence to Evgenii Vinarskii .

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Vinarskii, E., Laputenko, A., Yevtushenko, N. (2020). Using an SMT Solver for Checking the Completeness of FSM-Based Tests. In: Casola, V., De Benedictis, A., Rak, M. (eds) Testing Software and Systems. ICTSS 2020. Lecture Notes in Computer Science(), vol 12543. Springer, Cham. https://doi.org/10.1007/978-3-030-64881-7_18

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  • DOI: https://doi.org/10.1007/978-3-030-64881-7_18

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-64880-0

  • Online ISBN: 978-3-030-64881-7

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