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Strain-Rate Sensitivity (SRS) of Nickel by Instrumented Indentation

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MEMS and Nanotechnology, Volume 6

Abstract

For materials which exhibit a power-law relationship between stress and strain rate, it is theoretically possible to evaluate the exponent (m) which governs the relationship by means of instrumented indentation. However, in practice, tests at small strain rates take so long that the results can easily be dominated by thermal drift. A new test method is developed in which several constant strain rates are examined within a single indentation test by switching strain rates as the indenter continues to move into the material. Switching strain rates within a single test overcomes the problem of long testing times by examining large strain rates first and transitioning to smaller strain rates as the test proceeds. The new method is used to test a sample of fine-grained nickel sold by NIST as a standard reference material for Vickers hardness. The strain-rate sensitivity of this sample is measured to be m = 0.021. This value is in good agreement with values obtained by others on fine-grained nickel using both instrumented indentation and uniaxial creep testing.

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Notes

  1. 1.

    Strictly, the term “indentation strain rate” refers to the displacement rate divided by the displacement (\( \dot{h} \)/h). However, beginning with the definition of hardness, it is easily shown that \( \dot{h} \)/h ≈ 0.5(\( \dot{P} \)/P). Equation 8.2 holds true for either definition of strain rate, because the constant difference between the two definitions (0.5) is simply absorbed into the constant B. Because the Agilent G200 NanoIndenter is a force-controlled instrument, it is logistically easier to control \( \dot{P} \)/P than \( \dot{h} \)/h. Thus, in this work, the term “strain rate” refers to \( \dot{P} \)/P, unless specifically stated otherwise.

References

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Correspondence to Jennifer Hay .

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© 2013 The Society for Experimental Mechanics

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Hay, J., Maier, V., Durst, K., Göken, M. (2013). Strain-Rate Sensitivity (SRS) of Nickel by Instrumented Indentation. In: Shaw, G., Prorok, B., Starman, L. (eds) MEMS and Nanotechnology, Volume 6. Conference Proceedings of the Society for Experimental Mechanics Series. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-4436-7_8

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  • DOI: https://doi.org/10.1007/978-1-4614-4436-7_8

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  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4614-4435-0

  • Online ISBN: 978-1-4614-4436-7

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