Abstract
Materials science is an interdisciplinary field devoted to understanding the fundamental origins of materials’ properties to develop and sustain materials technology and engineering. Atom probe microscopy enables the characterisation of many important microstructural features that occur across various length scales in materials. This microscopy can enable new insights into the scientific and engineering aspects of how materials actually work. APM techniques enable the characterisation of the structure and the chemistry of materials, and this is of great significance because both are vital in formulating relationships between microstructure and properties. This short chapter explains how the different methods described previously can be applied to obtain information relevant to the materials scientist.
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References
H.N. Southworth, Surf. Sci. 23(1), 160–176 (1970)
J. Gallot, D.A. Smith, Rev. Phys. Appl. 6(1), 11–18 (1971)
A.S. Berger, D.N. Seidman, R.W. Balluffi, Acta Metall. 21(2), 137–147 (1973)
R.M. Scanlan, D.L. Styris, D.N. Seidman, Philos. Mag. 23(186), 1439–1457 (1971)
D.A. Smith, M.A. Fortes, A. Kelly, B. Ralph, Philos. Mag. 17(149), 1065–1077 (1968)
K.M. Bowkett, D.A. Smith, Field-Ion Microscopy (North-Holland Pub. Co., Amsterdam, 1970)
D. Blavette, E. Cadel, A. Fraczkiewicz, A. Menand, Science 286, 5448 (1999)
M.K. Miller, Microsc. Res. Tech. 69(5), 359–365 (2006)
C.A. Williams, E.A. Marquis, A. Cerezo, G.D.W. Smith, J. Nucl. Mater. 400(1), 37–45 (2010)
A. Etienne, B. Radiguet, N.J. Cunningham, G.R. Odette, P. Pareige, J. Nucl. Mater. 406(2), 244–250 (2010)
A. Etienne, B. Radiguet, N.J. Cunningham, G.R. Odette, R. Valiev, P. Pareige, Ultramicroscopy 111(6), 659–663 (2011)
M.K. Miller, L. Longstreth-Spoor, K.F. Kelton, Ultramicroscopy 111(6), 469–472 (2011)
J.M. Hyde, M.G. Burke, B. Gault, D.W. Saxey, P. Styman, K.B. Wilford, T.J. Williams, Ultramicroscopy 111(6), 676–682 (2011)
S.P. Ringer, T. Sakurai, I.J. Polmear, Acta Mater. 45, 3731 (1997)
S.P. Ringer, Mater. Sci. Forum 519–521, 25 (2006)
L.T. Stephenson, M.P. Moody, S.P. Ringer, Philos. Mag. 91(17), 2200–2215 (2011)
L.T. Stephenson, PhD Thesis, The University of Sydney, 2009
H.N. Southworth, B. Ralph, Philos. Mag. 14(128), 383 (1966)
T.T. Tsong, E.W. Müller, Appl. Phys. Lett. 9(1), 7–10 (1966)
T. Boll, T. Al Kassab, Y. Yuan, Z.G. Liu, Ultramicroscopy 107, 796–801 (2007)
M.K. Miller, J.A. Horton, Scripta Metall. 20(8), 1125–1130 (1986)
T. Rademacher, T. Al-Kassab, J. Deges, R. Kirchheim, Ultramicroscopy 111(6), 719–724 (2011)
A. Almazouzi, H. Numakura, M. Koiwa, K. Hono, T. Sakurai, Intermetallics 5(1), 37–43 (1997)
K. Hono, A. Chiba, T. Sakurai, S. Hanada, Acta Metall. Mater. 40(3), 419–425 (1992)
S. Kim, D. Nguyen-Manh, G.D.W. Smith, D.G. Pettifor, Philos. Mag. A 80(11), 2489–2508 (2000)
H. Murakami, H. Harada, H. Bhadeshia, Appl. Surf. Sci. 76(1–4), 177–183 (1994)
J.W. Cahn, Acta Metall. 9(9), 795–801 (1961)
J.W. Cahn, Trans. Metall. Soc. Aime 242(2), 166–180 (1968)
F. Danoix, P. Auger, Mater. Charact. 44(1–2), 177–201 (2000)
F. Danoix, P. Auger, D. Blavette, Surf. Sci. 266(1–3), 364–369 (1992)
M.G. Hetherington, J.M. Hyde, M.K. Miller, G.D.W. Smith, Surf. Sci. 246(1–3), 304–314 (1991)
K. Hono, S.S. Babu, K. Hiraga, R. Okano, T. Sakurai, Acta Metall. Mater. 40(11), 3027–3034 (1992)
M.K. Miller, J.M. Hyde, A. Cerezo, G.D.W. Smith, Appl. Surf. Sci. 87–8(1–4), 323–328 (1995)
F. Danoix, P. Auger, D. Blavette, Microsc. Microanal. 10(3), 349–354 (2004)
J.S. Langer, M. Baron, H.D. Miller, Phys. Rev. A 11(4), 1417–1429 (1975)
I. Baker, R.K. Zheng, D.W. Saxey, S. Kuwano, M.W. Wittmann, J.A. Loudis, K.S. Prasad, Z.W. Liu, R. Marceau, P.R. Munroe, S.P. Ringer, Intermetallics 17(11), 886–893 (2009)
E.O. Hall, Proc. Phys. Soc. Lond. Sect. B 64(381), 747–753 (1951)
N.J. Petch, J. Iron Steel Inst. 174(1), 25–28 (1953)
D.G. Brandon, B. Ralph, S. Ranganathan, M.S. Wald, Acta Metall. 12(7), 813–821 (1964)
Y. Ishida, D.A. Smith, Scripta Metall. 8(3), 293–298 (1974)
M.A. Fortes, B. Ralph, Acta Metall. 15(5), 707–720 (1967)
M.A. Fortes, D.A. Smith, J. Appl. Phys. 41(6), 2348–2359 (1970)
A.R. Waugh, M.J. Southon, Surf. Sci. 89, 718–724 (1979)
D.J. Larson, A.K. Petford-Long, A. Cerezo, G.D.W. Smith, D.T. Foord, T.C. Anthony, Appl. Phys. Lett. 73(8), 1125–1127 (1998)
P. Adusumilli, C.E. Murray, L.J. Lauhon, O. Avayu, Y. Rosenwaks, D.N. Seidman, in Proceedings of Advanced gate stack, source/drain and channel engineering for Si-based CMOS 5; new materials, processes and equipment, vol. 19, ed. by V. Narayanan et al. (ECS Transactions, Pennington, NJ, 2009), pp. 303–314
D.J. Larson, A. Cerezo, P.H. Clifton, A.K. Petford-Long, R.L. Martens, T.F. Kelly, N. Tabat, J. Appl. Phys. 89(11), 7517–7521 (2001)
D.J. Larson, A.K. Petford-Long, A. Cerezo, S.P. Bozeman, A. Morrone, Y.Q. Ma, A. Georgalakis and P.H. Clifton. Phys. Rev. B 67(14) (2003)
A.K. Petford-Long, Int. J. Mater. Res. 101(1), 16–20 (2010)
O.C. Hellman, J.A. Vandenbroucke, J. Rusing, D. Isheim, D.N. Seidman, Microsc. Microanal. 6(5), 437–444 (2000)
D.J. Larson, A.K. Petford-Long, A. Cerezo, G.D.W. Smith, Acta Mater. 47(15–16), 4019–4024 (1999)
G. Schmitz, C.-B. Ene, C. Nowak, Acta Mater. 57(9), 2673–2683 (2009)
V. Vovk, G. Schmitz, R. Kirchheim, Microelectron. Eng. 70(2–4), 533–538 (2003)
C.B. Ene, G. Schmitz, R. Kirchheim, A. Hutten, Acta Mater. 53(12), 3383–3393 (2005)
R. Larde, L. Lechevallier, A. Zarefy, A. Bostel, J. Juraszek, J.M. Le Breton, B. Rodmacq, B. Dieny, J. Appl. Phys. 105(8) (2009)
X. Sauvage, F. Wetscher, P. Pareige, Acta Mater. 53(7), 2127–2135 (2005)
O. Cojocaru-Miredin, D. Mangelinck, D. Blavette, J. Appl. Phys. 108(3) (2010)
O. Cojocaru-Miredin, D. Mangelinck, K. Hoummada, E. Cadel, D. Blavette, B. Deconihout, C. Perrin-Pellegrino, Scr. Mater. 57(5), 373–376 (2007)
K. Hoummada, E. Cadel, D. Mangelinck, C. Perrin-Pellegrino, D. Blavette, B. Deconihout, Appl. Phys. Lett. 89(18) (2006)
K. Hono, Y. Zhang, A.P. Tsai, A. Inoue, T. Sakurai, Scripta Metall. Mater. 32(2), 191–196 (1995)
M.K. Miller, C.T. Liu, J.A. Wright, W. Tang, K. Hildal, Intermetallics 14(8–9), 1019–1026 (2006)
M.K. Miller, T.D. Shen, R.B. Schwarz, J. Non-Cryst. Solids 317(1–2), 10–16 (2003)
L. Yang, M.K. Miller, X.L. Wang, C.T. Liu, A.D. Stoica, D. Ma, J. Almer, D. Shi, Adv. Mater. 21(3), 305–308 (2009)
I. Martin, T. Ohkubo, M. Ohnuma, B. Deconihout, K. Hono, Acta Mater. 52(15), 4427–4435 (2004)
W.H. Wang, Prog. Mater. Sci. 52(4), 540–596 (2007)
D.C. Hofmann, J.Y. Suh, A. Wiest, G. Duan, M.L. Lind, M.D. Demetriou, W.L. Johnson, Nature 451(7182), 1085–U1083 (2008)
Z.F. Zhang, G. He, J. Eckert, L. Schultz, Phys. Rev. Lett. 91(4) (2003)
G. Wang, J. Shen, J.F. Sun, Y.J. Huang, J. Zou, Z.P. Lu, Z.H. Stachurski, B.D. Zhou, J. Non-Cryst. Solids 351(3), 209–217 (2005)
E.S. Park, D.H. Kim, Metals Mater. Int. 11(1), 19–27 (2005)
J. Schroers, Adv. Mater. 22(14), 1566–1597 (2010)
Z.F. Zhang, F.F. Wu, G. He, J. Eckert, J. Mater. Sci. Technol. 23(6), 747–767 (2007)
M.K. Miller, R.B. Schwarz, Y. He, Bulk metallic glasses, ed. by W.L. Johnson, A. Inoue, C.T. Liu. Mater. Res. Symp. Proc. 554, 9–14 (1999)
D. Haley, T. Petersen, G. Barton, S.P. Ringer, Philos. Mag. 89(11), 925–943 (2009)
A. Shariq, T. Al-Kassab, R. Kirchheim, R.B. Schwarz, Ultramicroscopy 107(9), 773–780 (2007)
E.W. MĂĽller, T.T. Tsong, Field Ion Microscopy, Principles and Applications (Elsevier, New York, NY, 1969)
T.T. Tsong, Atom-Probe Field Ion Microscopy: Field Emission, Surfaces and Interfaces at Atomic Resolution (Cambridge University Press, New York, NY, 1990)
M.K. Miller, A. Cerezo, M.G. Hetherington, G.D.W. Smith, Atom Probe Field Ion Microscopy (Oxford Science Publications - Clarendon Press, Oxford, 1996)
M.K. Miller, G.D.W. Smith, Atom Probe Microanalysis: Principles and Applications to Materials Problems (Materials Research Society, Pittsburg, PA, 1989)
Y.S. Ng, T.T. Tsong, Surf. Sci. 78(2), 419–438 (1978)
Y.S. Ng, T.T. Tsong, S.B. McLane, Surf. Sci. 84(1), 31–53 (1979)
H.C. Eaton, L. Lee, J. Appl. Phys. 53(2), 988–994 (1982)
D. Blavette, A. Bostel, J.M. Sarrau, B. Deconihout, A. Menand, Nature 363, 432–435 (1993)
D. Blavette, B. Deconihout, A. Bostel, J.M. Sarrau, M. Bouet, A. Menand, Rev. Sci. Instrum. 64(10), 2911–2919 (1993)
P. Bas, A. Bostel, B. Deconihout, D. Blavette, Appl. Surf. Sci. 87–88, 298–304 (1995)
J.M. Hyde, A. Cerezo, R.P. Setna, P.J. Warren, G.D.W. Smith, Applied Surface Science 76/77, 382–391 (1994)
P.J. Warren, A. Cerezo, G.D.W. Smith, Ultramicroscopy 73(1–4), 261–266 (1998)
A. Lukaszewski, A. Szczepkowicz, Vacuum 54(1–4), 67–71 (1999)
F. Vurpillot, G. Da Costa, A. Menand, D. Blavette, J. Microsc. 203, 295–302 (2001)
F. Vurpillot, L. Renaud, D. Blavette, Ultramicroscopy 95(1–4), 223–229 (2003)
B.P. Geiser, T.F. Kelly, D.J. Larson, J. Schneir, J.P. Roberts, Microsc. Microanal. 13(6), 437–447 (2007)
B. Gault, F. de Geuser, L.T. Stephenson, M.P. Moody, B.C. Muddle, S.P. Ringer, Microsc. Microanal. 14(4), 296–305 (2008)
B. Gault, M.P. Moody, F. De Geuser, G. Tsafnat, A. La Fontaine, L.T. Stephenson, D. Haley, S.P. Ringer, J. Appl. Phys. 105, 034913 (2009)
E.A. Marquis, B.P. Geiser, T.J. Prosa, D.J. Larson, J. Microsc. 241(3), 225–233 (2011)
R. Larde, L. Lechevallier, A. Zarefy, A. Bostel, J. Juraszek, J.M. Le Breton, B. Rodmacq, B. Dieny, J. Appl. Phys. 105(8), 084307 (2009)
R. Larde, E. Talbot, P. Pareige, H. Bieber, G. Schmerber, S. Colis, V. Pierron-Bohnes, A. Dinia, J. Am. Chem. Soc. 133(5), 1451–1458 (2011)
E. Cadel, F. Vurpillot, R. Larde, S. Duguay, B. Deconihout, J. Appl. Phys. 106(4), 044908 (2009)
K. Hoummada, D. Mangelinck, B. Gault, M. Cabie, Scr. Mater. 64(5), 378–381 (2011)
W.K. Yeoh, B. Gault, X.Y. Cui, C. Zhu, M.P. Moody, L. Li, R.K. Zheng, W.X. Li, X.L. Wang, S.X. Dou, C.T. Lin, S.P. Ringer, Phys. Rev. Lett. 106, 247002 (2011)
P.J. Warren, A. Cerezo, G.D.W. Smith, Microsc. Microanal. 5, 89–90 (1998)
M.P. Moody, B. Gault, L.T. Stephenson, D. Haley, S.P. Ringer, Ultramicroscopy 109, 815–824 (2009)
B. Gault, D. Haley, F. de Geuser, D.J. Larson, E.A. Marquis, B.P. Geiser, Ultramicroscopy 111(6), 448–457 (2011)
M.P. Moody, F. Tang, B. Gault, S.P. Ringer, J.M. Cairney, Ultramicroscopy 111(6), 493–499 (2011)
P.V. Liddicoat, X.Z. Liao, Y.H. Zhao, Y.T. Zhu, M.Y. Murashkin, E.J. Lavernia, R.Z. Valiev, S.P. Ringer, Nat. Commun. 1, 63 (2010)
G. Sha, L. Yao, X. Liao, S.P. Ringer, Z. Chao Duan, T.G. Langdon, Ultramicroscopy 111(6), 500–505 (2011)
H. Gleiter, Acta Mater. 48(1), 1–29 (2000)
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Gault, B., Moody, M.P., Cairney, J.M., Ringer, S.P. (2012). Atom Probe Microscopy and Materials Science. In: Atom Probe Microscopy. Springer Series in Materials Science, vol 160. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-3436-8_9
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