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Backscattering Detector and EBSD in Nanomaterials Characterization

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Scanning Microscopy for Nanotechnology

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References

  1. T. M. Maitland, unpublished work (2005).

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  2. Figures 2.2–2.4, assistance of Robert Schwarzer is gratefully acknowledged.

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Author information

Authors and Affiliations

  1. HKL Technology Inc., 52A Federal Road, Unit 2D, 6810, Danbury, CT

    Tim Maitland

  2. HKL Technology Inc., 52A Federal Road, Unit 2D, 6810, Danbury, CT

    Scott Sitzman

Authors
  1. Tim Maitland
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  2. Scott Sitzman
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Editor information

Editors and Affiliations

  1. College of Sciences, University of New Orleans, 70148, New Orleans, Louisiana, USA

    Weilie Zhou

  2. Center of Nanotechnology and Nanoscience, Georgia Institute of Technology, 30332-0245, Atlanta, Georgia, USA

    Zhong Lin Wang

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© 2006 Springer Science+Business Media, LLC

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Maitland, T., Sitzman, S. (2006). Backscattering Detector and EBSD in Nanomaterials Characterization. In: Zhou, W., Wang, Z.L. (eds) Scanning Microscopy for Nanotechnology. Springer, New York, NY. https://doi.org/10.1007/978-0-387-39620-0_2

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