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Light intensification effect of trailing indent crack in fused silica subsurface

熔石英亚表面trailing indent划痕诱导的光增强效应

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Abstract

A finite-difference time-domain algorithm was applied to solve Maxwell’s equations to obtain the redistribution of an electromagnetic plane wave in the vicinity of a trailing indent crack (TIC). The roles of five geometrical parameters playing in light intensification were calculated numerically under the irradiation of a 355-nm normal incidence laser. The results show that the light intensity enhancements between the nearest neighbor pits were remarkable, which may lead to damage. The calculated results reveal that the light intensity enhancement factor (LIEF) can be up to 11.2 when TIC is on the rear-surface. With the increase of the length as well as the depth of pits, LIEF increased. Conversely, with the increase of the axis of pits, LIEF gradually declined to a stable status. It was observed that there exists an optima width or gap, which enables LIEF to be increased dramatically and then decreased gently. By comparison, results suggest that the worst cases occur when the depth and the length are both very large, especially if the width equals to 2 l and the gap equals the width. This work provides a recommended theoretical criterion for defect inspection and classification.

研究意义

在强紫外激光辐照下,熔石英元件亚表面缺陷极易诱导激光损伤.因此,缺陷诱导光场重分布的量 化,为光学元件亚表面缺陷的检测和分类提供了依据,同时也促进了高功率激光器负载能力的提高.本工作系 统研究了一类特殊的锥型划痕—trailing indent划痕对近场光调制的影响,该项工作的主要目的是为这类缺陷的检 测提供依据,以及在工程上提出控制策略.

创新要点

  1. (1)

    最大光强处位于坑点凸起的一侧,此处最易产生激光诱导损伤,与实验结果一致.

  2. (2)

    细致地研究了五个几何参数与光增强之间的关联.

  3. (3)

    提出了这类缺陷在工程应用上的控制策略.

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Authors and Affiliations

  1. Key Laboratory of Information Materials of Sichuan Province, College of Electrical & Information Engineering, Southwest University for Nationalities, Chengdu, 610041, China

    ChunLai Zhang & Ming Xu

  2. School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu, 610054, China

    ChunLai Zhang

  3. Laboratory of Solid-State Physics and Magnetism, Department of Physics and Astronomy, KU Leuven, Leuven, 3001, Belgium

    ChunDong Wang

Authors
  1. ChunLai Zhang
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  2. Ming Xu
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Correspondence to ChunLai Zhang or ChunDong Wang.

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Zhang, C., Xu, M. & Wang, C. Light intensification effect of trailing indent crack in fused silica subsurface. Sci. China Phys. Mech. Astron. 58, 1–6 (2015). https://doi.org/10.1007/s11433-014-5506-1

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  • DOI: https://doi.org/10.1007/s11433-014-5506-1

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