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Dynamic low-temperature scanning force microscopy on nickel oxide (001)

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Abstract.

We present atomically resolved images of nickel oxide (001) obtained with low temperature non-contact atomic force microscopy. Using iron coated silicon cantilevers, it is possible to distinguish defects with a vertical resolution of less than 10 pm and to obtain atomic resolution across step edges on the upper and lower terrace within 1 nm of the edge. The noise level in these images could be reduced to ≈1.5 pm.

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Authors and Affiliations

  1. Institute of Applied Physics and Microstructure Research Center, University of Hamburg, Jungiusstr. 11, 20355 Hamburg, Germany, DE

    W. Allers, S. Langkat & R. Wiesendanger

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  1. W. Allers
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  2. S. Langkat
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  3. R. Wiesendanger
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Received: 16 July 2000 / Accepted: 14 December 2000 / Published online: 27 March 2001

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Allers, W., Langkat, S. & Wiesendanger, R. Dynamic low-temperature scanning force microscopy on nickel oxide (001) . Appl Phys A 72 (Suppl 1), S27–S30 (2001). https://doi.org/10.1007/s003390100731

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  • DOI: https://doi.org/10.1007/s003390100731

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