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Non-contact atomic force microscopy of an antiferromagnetic NiO(100) surface using a ferromagnetic tip

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Abstract.

We have observed a cleaved NiO(100) surface by means of non-contact atomic force microscopy (NC-AFM) using a Fe-coated tip. The shape and magnetic properties of the Fe-coated tip are confirmed by ex situ scanning electron microscopy (SEM) and magnetic force microscopy (MFM) imaging. Also, in situ Δf–vmeasurement shows that the contact-potential difference (CPD) is different between non-coated Si and Fe-coated tips. The Fe-coated tip can produce atomically resolved NC-AFM images of a cleaved NiO(100) surface at room temperature.

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Authors and Affiliations

  1. Core Research for Evolutional Science and Technology (CREST), Japan Science and Technology Corporation (JST), Sapporo 060-8628, Japan (E-mail: hosoi@nano.eng.hokudai.ac.jp), JP

    H. Hosoi, M. Kimura, K. Sueoka & K. Mukasa

  2. Hokkaido Foundation for Promotion of Scientific and Industrial Technology (Hokscitec Foundation), Sapporo 060-0001, Japan, JP

    K. Hayakawa

Authors
  1. H. Hosoi
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  2. M. Kimura
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  3. K. Hayakawa
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  4. K. Sueoka
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  5. K. Mukasa
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Received: 16 July 2000 / Accepted: 14 December 2000 / Published online: 27 March 2001

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Hosoi, H., Kimura, M., Hayakawa, K. et al. Non-contact atomic force microscopy of an antiferromagnetic NiO(100) surface using a ferromagnetic tip . Appl Phys A 72 (Suppl 1), S23–S26 (2001). https://doi.org/10.1007/s003390100722

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  • DOI: https://doi.org/10.1007/s003390100722

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