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Specifics of electromagnetic radiation effects on integrated circuits

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Abstract

Modern regulations [1] stress the necessity of testing integrated circuits (ICs) in order to determine the real level of their resistance to single voltage pulses induced by electromagnetic radiation (EMR). With expansion of the EMR spectral composition, however, direct energy release can occur due to the absorption of the EMR field energy by the IC chip itself. To assess this possibility, the relationship is found between different mechanisms of the EMR-induced energy release for the typical irradiation geometry.

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Authors and Affiliations

  1. National Research Nuclear University MEPhI, Moscow, 115409, Russia

    P. K. Skorobogatov, K. A. Epifantsev & V. A. Telets

  2. Specialized Electronic Systems (SPELS), Moscow, 115409, Russia

    P. K. Skorobogatov

  3. Impul’snaya tekhnika Research and Production Center, Dukhov All-Russia Research Institute of Automatics, Moscow, 115304, Russia

    O. A. Gerasimchuk

Authors
  1. P. K. Skorobogatov
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  2. O. A. Gerasimchuk
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  3. K. A. Epifantsev
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  4. V. A. Telets
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Corresponding author

Correspondence to P. K. Skorobogatov.

Additional information

Original Russian Text © P.K. Skorobogatov, O.A. Gerasimchuk, K.A. Epifantsev, V.A. Telets, 2017, published in Mikroelektronika, 2017, Vol. 46, No. 3, pp. 181–186.

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Skorobogatov, P.K., Gerasimchuk, O.A., Epifantsev, K.A. et al. Specifics of electromagnetic radiation effects on integrated circuits. Russ Microelectron 46, 166–170 (2017). https://doi.org/10.1134/S1063739717030088

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  • DOI: https://doi.org/10.1134/S1063739717030088

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