Homologous series of layered structures in binary and ternary Bi-Sb-Te-Se systems: Ab initio study

K. Govaerts, M. H. F. Sluiter, B. Partoens, and D. Lamoen
Phys. Rev. B 89, 054106 – Published 28 February 2014
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Abstract

In order to account explicitly for the existence of long-periodic layered structures and the strong structural relaxations in the most common binary and ternary alloys of the Bi-Sb-Te-Se system, we have developed a one-dimensional cluster expansion (CE) based on first-principles electronic structure calculations, which accounts for the Bi and Sb bilayer formation. Excellent interlayer distances are obtained with a van der Waals density functional. It is shown that a CE solely based on pair interactions is sufficient to provide an accurate description of the ground-state energies of Bi-Sb-Te-Se binary and ternary systems without making the data set of ab initio calculated structures unreasonably large. For the binary alloys A1xQx (A=Sb, Bi; Q=Te, Se), a ternary CE yields an almost continuous series of (meta)stable structures consisting of consecutive A bilayers next to consecutive A2Q3 for 0<x<0.6. For x>0.6, the binary alloy segregates into pure Q and A2Q3. The Bi-Sb system is described by a quaternary CE and is found to be an ideal solid solution stabilized by entropic effects at T0 K but with an ordered structure of alternating Bi and Sb layers for x=0.5 at T=0 K. A quintuple CE is used for the ternary Bi-Sb-Te system, where stable ternary layered compounds with an arbitrary stacking of Sb2Te3, Bi2Te3, and Te-Bi-Te-Sb-Te quintuple units are found, optionally separated by mixed Bi/Sb bilayers. Electronic properties of the stable compounds were studied taking spin-orbit coupling into account.

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  • Received 12 September 2013
  • Revised 13 February 2014

DOI:https://doi.org/10.1103/PhysRevB.89.054106

©2014 American Physical Society

Authors & Affiliations

K. Govaerts1,*, M. H. F. Sluiter2, B. Partoens3, and D. Lamoen1

  • 1EMAT, Universiteit Antwerpen, Groenenborgerlaan 171, 2020 Antwerpen, Belgium
  • 2Department of Materials Science and Engineering, 3mE, Delft University of Technology, Mekelweg 2, 2628 CD, Delft, The Netherlands
  • 3CMT group, Department of Physics, Universiteit Antwerpen, Groenenborgerlaan 171, 2020 Antwerpen, Belgium

  • *kirsten.govaerts@ua.ac.be

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Issue

Vol. 89, Iss. 5 — 1 February 2014

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