Procedure to count atoms with trustworthy single-atom sensitivity

S. Van Aert, A. De Backer, G. T. Martinez, B. Goris, S. Bals, G. Van Tendeloo, and A. Rosenauer
Phys. Rev. B 87, 064107 – Published 19 February 2013

Abstract

We report a method to reliably count the number of atoms from high-angle annular dark field scanning transmission electron microscopy images. A model-based analysis of the experimental images is used to measure scattering cross sections at the atomic level. The high sensitivity of these measurements in combination with a thorough statistical analysis enables us to count atoms with single-atom sensitivity. The validity of the results is confirmed by means of detailed image simulations. We will show that the method can be applied to nanocrystals of arbitrary shape, size, and atom type without the need for a priori knowledge about the atomic structure.

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  • Received 2 July 2012

DOI:https://doi.org/10.1103/PhysRevB.87.064107

©2013 American Physical Society

Authors & Affiliations

S. Van Aert*, A. De Backer, G. T. Martinez, B. Goris, S. Bals, and G. Van Tendeloo

  • EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium

A. Rosenauer

  • Institut für Festkörperphysik, Universität Bremen, Otto-Hahn-Allee 1, D-28359 Bremen, Germany

  • *sandra.vanaert@ua.ac.be

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Vol. 87, Iss. 6 — 1 February 2013

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