IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Online ISSN : 1745-1337
Print ISSN : 0916-8508
Special Section on Signal Processing
Interscale Stein's Unbiased Risk Estimate and Intrascale Feature Patches Distance Constraint for Image Denoising
Qieshi ZHANGSei-ichiro KAMATAAlireza AHRARY
Author information
JOURNAL RESTRICTED ACCESS

2010 Volume E93.A Issue 8 Pages 1434-1441

Details
Abstract

The influence of noise is an important problem on image acquisition and transmission stages. The traditional image denoising approaches only analyzing the pixels of local region with a moving window, which calculated by neighbor pixels to denoise. Recently, this research has been focused on the transform domain and feature space. Compare with the traditional approaches, the global multi-scale analyzing and unchangeable noise distribution is the advantage. Apparently, the estimation based methods can be used in transform domain and get better effect. This paper proposed a new approach to image denoising in orthonormal wavelet domain. In this paper, we adopt Stein's unbiased risk estimate (SURE) based method to denoise the low-frequency bands and the feature patches distance constraint (FPDC) method also be proposed to estimate the noise free bands in Wavelet domain. The key point is that how to divide the lower frequency sub-bands and the higher frequency sub-bands, and do interscale SURE and intrascale FPDC, respectively. We compared our denoising method with some well-known and new denoising algorithms, the experimental results show that the proposed method can give better performance and keep more detail information in most objective and subjective criteria than other methods.

Content from these authors
© 2010 The Institute of Electronics, Information and Communication Engineers
Previous article Next article
feedback
Top