Abstract
Today, embedded systems are being used in many (safety-critical) applications. However, due to their decreasing feature size and supply voltage, such systems are more susceptible to external disturbances such as electromagnetic interference. These external disturbances are able to introduce bit-flips inside the microcontroller’s hardware. In turn, these bit-flips may also corrupt the software. A possible software corruption is a control flow error. This paper proposes a new software-implemented control flow error detection technique. The advantage of our technique, called Random Additive Control Flow Error Detection, is a high detection ratio with a low execution time overhead. Most control flow errors are detected, while having a lower execution time overhead than the considered existing techniques.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Cortex-M3, December 2017. https://developer.arm.com/products/processors/cortex-m/cortex-m3
Integrating IoT and advanced technology design, application development and processing environments (2017). https://m.eet.com/media/1246048/2017-embedded-market-study.pdf
Baffreau, S., Bendhia, S., Ramdani, M., Sicard, E.: Characterisation of microcontroller susceptibility to radio frequency interference. In: Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems, pp. 1031.1–1031.5. IEEE (2002)
Baumann, R.: Soft errors in advanced computer systems. IEEE Des. Test Comput. 22(3), 258–266 (2005)
De Keulenaer, R.: Softwarebeveiliging van smartcards tegen laseraanvallen. Master’s thesis, Universiteit Gent (2013)
Guthaus, M.R., Ringenberg, J.S., Ernst, D., Austin, T.M., Mudge, T., Brown, R.B.: MiBench: a free, commercially representative embedded benchmark suite. In: 2001 IEEE International Workshop on Workload Characterization, WWC-4, pp. 3–14. IEEE (2001)
Jagannathan, S., et al.: Temperature dependence of soft error rate in flip-flop designs. In: 2012 IEEE International Reliability Physics Symposium (IRPS), pp. SE.2.1–SE.2.6. IEEE (2012)
Li, A., Hong, B.: Software implemented transient fault detection in space computer. Aerosp. Sci. Technol. 11(2), 245–252 (2007)
Nicolescu, B., Savaria, Y., Velazco, R.: SIED: software implemented error detection. In: 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Proceedings, pp. 589–596. IEEE (2003)
Oh, N., Shirvani, P.P., McCluskey, E.J.: Control-flow checking by software signatures. IEEE Trans. Reliab. 51(1), 111–122 (2002)
Sangchoolie, B., Pattabiraman, K., Karlsson, J.: One bit is (not) enough: an empirical study of the impact of single and multiple bit-flip errors. In: Proceedings of 47th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), pp. 97–108, June 2017
Sierawski, B.D., et al.: Effects of scaling on muon-induced soft errors. In: 2011 IEEE International Reliability Physics Symposium (IRPS), pp. 3C.3.1–3C.3.6. IEEE (2011)
Tang, A., Sethumadhavan, S., Stolfo, S.: CLKSCREW: exposing the perils of security-oblivious energy management. In: 26th USENIX Security Symposium (USENIX Security 17), Vancouver, BC, pp. 1057–1074. USENIX Association (2017). ISBN 978-1-931971-40-9
Vankeirsbilck, J., Penneman, N., Hallez, H., Boydens, J.: Random additive signature monitoring for control flow error detection. IEEE Trans. Reliab. 66(4), 1178–1192 (2017)
Vankeirsbilck, J., Thati, V.B., Waes, J.V., Hallez, H., Boydens, J.: Control flow aware software-implemented fault injection for embedded CPUs. In: Proceedings of XXVI International Scientific Conference on Electronics (ET), pp. 1–4, September 2017
Acknowledgement
This work is supported by a research grant from the Baekeland program of the Flemish Agency for Innovation and Entrepreneurship (VLAIO) in cooperation with Televic Healthcare NV, under grant agreement IWT 150696.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2018 Springer Nature Switzerland AG
About this paper
Cite this paper
Vankeirsbilck, J., Penneman, N., Hallez, H., Boydens, J. (2018). Random Additive Control Flow Error Detection. In: Gallina, B., Skavhaug, A., Bitsch, F. (eds) Computer Safety, Reliability, and Security. SAFECOMP 2018. Lecture Notes in Computer Science(), vol 11093. Springer, Cham. https://doi.org/10.1007/978-3-319-99130-6_15
Download citation
DOI: https://doi.org/10.1007/978-3-319-99130-6_15
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-99129-0
Online ISBN: 978-3-319-99130-6
eBook Packages: Computer ScienceComputer Science (R0)