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陈树林, 高鹏. 原位电子显微学探索固体中的离子迁移行为[J]. 物理, 2019, 48(3): 168-179. DOI: 10.7693/wl20190306
引用本文: 陈树林, 高鹏. 原位电子显微学探索固体中的离子迁移行为[J]. 物理, 2019, 48(3): 168-179. DOI: 10.7693/wl20190306
CHEN Shu-Lin, GAO Peng. Probing ion migration behavior in solids by in situ electron microscopy[J]. PHYSICS, 2019, 48(3): 168-179. DOI: 10.7693/wl20190306
Citation: CHEN Shu-Lin, GAO Peng. Probing ion migration behavior in solids by in situ electron microscopy[J]. PHYSICS, 2019, 48(3): 168-179. DOI: 10.7693/wl20190306

原位电子显微学探索固体中的离子迁移行为

Probing ion migration behavior in solids by in situ electron microscopy

  • 摘要: 离子在固体材料中的迁移是很多应用的基础,包括锂离子电池、存取器件及催化剂等。研究固体材料中的离子迁移行为是固态离子学的核心内容。微观上,固体中离子迁移的行为取决于材料微观结构所确定的局域势垒特征。因此,研究离子迁移行为与微观结构的关联至为重要。文章讲述了具有高空间分辨率的原位透射电子显微镜技术用于锂离子电池材料、阻变存储材料等体系中离子迁移行为的研究现状与发展趋势。

     

    Abstract: Ion migration in solid materials is the basis of many applications, including lithium ion batteries, memory devices, catalysis, and so on. The dynamics and kinetics of ion migration are the core of solid state ionics. Microscopically, the behavior of ion migration depends on the local barrier characteristics determined by the microstructure of the material. Therefore, it is very important to study the relationship between ion migration and microstructure. In this paper, we describe the present status and development trends of research on ion migration behavior in solid materials such as lithium ion batteries and resistive random-access memory materials by in situ transmission electron microscopy.

     

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