Welcome to EU PVSEC User Area
Login
Document details
TitleAnalysis of the Degradation of 735 Commercial Crystalline Silicon Modules after First Operation Year
Author(s)Jorge Coello, Francesco Cornacchia, J. Muñoz
KeywordsPhotovoltaic (PV) Module, Quality Control, Testing and Characterisation
Topic Components for PV Systems
SubtopicPV Modules
Event25th EU PVSEC / WCPEC-5
Session4AV.3.18
Pages manuscript 4019 - 4022
ISBN3-936338-26-4
DOI10.4229/25thEUPVSEC2010-4AV.3.18
Abstract/Summary

This article intends to spread the results obtained in the degradation analysis of 735 crystalline silicon modules after first operation year. Degradation analysis carried out in this work consists of modules characterization in laboratory before field installation and after one year in operation in real conditions. This characterization includes peak power measurement according to IEC 61215 and additional indoor infrared thermographic inspection. Analyzed modules belong to two large PV plants located in the South of Spain. Analysis shows a general decreasing of electrical parameters values in the range between -1.0% to -3.5% in all modules. Measurements indicate that main power losses are due to short circuit current degradation. Furthermore, no new thermographic defects were detected after first operation year, but higher electrical losses have been observed in defective modules.

Download Manuscript
File Type: pdf
File Size: 377,46 KB
Preview Page 1
Preview Page 2
Organiser of the EU PVSEC 2024: WIP GmbH & Co Planungs-KG • Sylvensteinstr. 2 • 81369 München