X-Ray Scattering from Thin Films and Multilayers

David Rafaja

doi:10.4028/www.scientific.net/MSF.443-444.65

Paper Titles

Quantitative Phase Analysis Using the Rietveld Method - Estimates of Possible Problems Based on Two Interlaboratory Comparisons
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New Method for Estimation of the Magnesium Fraction in Magnesian Calcite
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XRD Study of the Nacrite/CsCl/H₂O Intercalation Complex
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X-Ray Scattering from Thin Films and Multilayers
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The Microstructure of Nanocrystalline Powders from Line Profile Analysis
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Elastic Behaviour of Thin Stabilized-Zirconia Coatings
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Characterization of Crystalline Silicon via XRPD
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Simulation of X-Ray Powder Diffraction Patterns for One-Dimensionally Disordered Crystals
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HomeMaterials Science ForumMaterials Science Forum Vols. 443-444X-Ray Scattering from Thin Films and Multilayers

X-Ray Scattering from Thin Films and Multilayers

Abstract:

Capability of the X-ray scattering for study of low-dimensional structures is illustrated on few examples. They are focused to the phase analysis, residual stress measurement, calculation of the stress-free lattice parameters, investigation of the anisotropic lattice deformation and preferred orientation in UN thin films. Further, the study of concentration profiles in functionally graded hard-metals and investigation of the multilayer degradation caused by soft annealing are discussed.

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Periodical:

Materials Science Forum (Volumes 443-444)

Pages:

65-70

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.443-444.65

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Online since:

January 2004

Authors:

David Rafaja

Keywords:

Functionally Graded Material (FGM), Glancing Angle X-Ray Diffraction (GAXRD), Low-Dimensional Structures, Small Angle X-Ray Scattering

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