Tools for Polycrystal Plasticity Analyses
p.67
p.67
Texture Development in Thin Films
p.75
p.75
20 Years WIMV, History, Experience and Contemporary Developments
p.95
p.95
New Concepts to Measure, Calculate and Analyze Textures in Materials
p.101
p.101
On the Development of New Scalar Measures of Heterogeneity
p.107
p.107
X-Ray Combined QTA Using a CPS Applied to a Ferroelectric Ultrastructure
p.113
p.113
Development of Grain-Orientation-Dependent Residual Stresses in Interstitial-Free Steel after Deformation
p.119
p.119
Stereology for Recovering Grain Boundary Plane Distributions in the Crystal Frame
p.125
p.125
Interactive and Quantitative Texture Determination by Consecutive Inverse Pole Figures
p.131
p.131
On the Development of New Scalar Measures of Heterogeneity
Abstract:
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Info:
Periodical:
Materials Science Forum (Volumes 408-412)
Pages:
107-112
Citation:
Online since:
August 2002
Price:
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