Different Surface Morphology of Annealed PVDF-TrFE Thin Films and the Effect on its Ferroelectric Properties

Mohamad Hafiz Mohd Wahid; Rozana Mohd Dahan; Siti Zaleha Sa'ad; Adillah Nurashikin Arshad; Muhamad Naiman Sarip; Habibah Zulkefle; Mohamad Rusop; Wee Chen Gan; Wan Haliza A. Majid

doi:10.4028/www.scientific.net/AMR.832.724

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 832Different Surface Morphology of Annealed PVDF-TrFE...

Different Surface Morphology of Annealed PVDF-TrFE Thin Films and the Effect on its Ferroelectric Properties

Abstract:

The different morphology of 250 nm PVDF-TrFE (70:30 mol%) thin films were observed in relation to its ferroelectricity. The annealing temperatures were varied from solvent evaporation (T_s), Curies transition (T_c), up to melting temperature (T_m). It was found that the annealing process promoted the development of elongated crystallite structure also known as ferroelectric crystal, which significantly improved the ferroelectric properties of PVDF-TrFE (70:30 mol%) thin films. However, the presence of nanoscale separations on the thin film annealed over T_m (AN160) suggested high possibility of defects, and hence a reduction in ferroelectric properties of thin films.

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Periodical:

Advanced Materials Research (Volume 832)

Pages:

724-727

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.832.724

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Online since:

November 2013

Authors:

Mohamad Hafiz Mohd Wahid*, Rozana Mohd Dahan, Siti Zaleha Sa'ad, Adillah Nurashikin Arshad, Muhamad Naiman Sarip, Habibah Zulkefle, Mohamad Rusop, Wee Chen Gan, Wan Haliza A. Majid

Keywords:

Ferroelectric, Morpholoy, PVDF-TrFE

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