Microdiffraction Study of Polycrystalline Copper during Uniaxial Tension Deformation Using a Synchrotron X-Ray Source

H.D. Joo; J.S. Kim; C.W. Bark; J.Y. Kim; Yang Mo Koo; Nobumichi Tamura

doi:10.4028/www.scientific.net/MSF.475-479.4149

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HomeMaterials Science ForumMaterials Science Forum Vols. 475-479Microdiffraction Study of Polycrystalline Copper...

Microdiffraction Study of Polycrystalline Copper during Uniaxial Tension Deformation Using a Synchrotron X-Ray Source

Abstract:

In-situ measurement of local orientation and strain Has Been carried out for a copperpolycrystals under a uniaxial loading using a synchrotron x-ray microdiffraction method at the Advanced Light Source. The heterogeneities of deformation-induced microstructure within single grains were observed. There were differences in the selection of simultaneously acting slip systems among neighboring volume elements within a grain.

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Periodical:

Materials Science Forum (Volumes 475-479)

Pages:

4149-4152

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.475-479.4149

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Online since:

January 2005

Authors:

H.D. Joo, J.S. Kim, C.W. Bark, J.Y. Kim, Yang Mo Koo, Nobumichi Tamura

Keywords:

Local Deformation, Microdiffraction, Polycrystal, Slip System, Tensile Axis Rotation

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