Defect Study on Si Implanted with B and BF2 Ions by Coincidence Doppler Broadening Measurements
p.469
p.469
Positron Annihilation in Si and Si-Related Materials in Thermal Equilibrium at High Temperature
p.472
p.472
Defect Property in He+ Implanted Silicon Probed by Slow Positron Beam
p.475
p.475
GaN Thin Films on SiC Substrates Studied Using Variable Energy Positron Annihilation Spectroscopy
p.478
p.478
Determination of Structural Vacancy Densities in Icosahedral Quasicrystals by Slow Positron Beam Technique
p.481
p.481
Depth-Dependence Recovery of Helium-Implanted 18 Carats Gold-Silver Alloy
p.484
p.484
Positron Dechanneling by Electronic and Nuclear Scattering
p.487
p.487
The Estimation of the Vacancy-Type Defects Density in Thin Fe Film with Slow Positron Beam
p.490
p.490
Positron Annihilation in Gaseous Nitrided Cold-Rolled FeNiTi Films
p.493
p.493
Determination of Structural Vacancy Densities in Icosahedral Quasicrystals by Slow Positron Beam Technique
Abstract:
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Info:
Periodical:
Materials Science Forum (Volumes 363-365)
Pages:
481-483
Citation:
Online since:
April 2001
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