Design, Fabrication and Characterization of 10kV/100A 4H-SiC PiN Power Rectifier

Article Preview

Abstract:

A 10kV/100A SiC PiN rectifier with MRM-JTE (multiple-ring modulated junction termination extension) is designed, fabricated and characterized. The optimized MRM-JTE achieves high breakdown capability and extends the optimal JTE dose window. A 100μm thick epitaxial SiC PiN rectifier with a doping concentration of 5×1014cm−3 has been fabricated using a standard TZ-JTE process. A 5.4V forward voltage drop is obtained at 100A forward current. Moreover, a measured breakdown voltage is up to 13.5kV corresponding to about 96% of the ideal parallel plane junction. The fabricated device exhibits a low RON,SP of 3.76mΩ·cm2 at 200A/cm2 , and a high BFOM of 48.5GW/cm2. In addition, the C-V characteristic and reverse recovery switch characteristic are also analyzed. In this paper, the successfully fabrication of high-voltage SiC PiN rectifier provides a further development for high-voltage high-power SiC power modules.

You might also be interested in these eBooks

Info:

Periodical:

Materials Science Forum (Volume 1014)

Pages:

115-119

Citation:

Online since:

November 2020

Export:

Price:

* - Corresponding Author

[1] Jose Millan Philippe Godignon, Et Al, A Survey of Wide Bandgap Power Semiconductor Devices, IEEE Trans. Power Electronic, 29 (2014) 2155-2163.

DOI: 10.1109/tpel.2013.2268900

Google Scholar

[2] Baliga B. Jayant, European Solid-State Device Research Conference pp.192-197 (2016).

Google Scholar

[3] Hiyoshi T Hori T, Suda J, Et Al, Simulation and Experimental Study on the Junction Termination Structure for High-Voltage 4H-SiC PiN Diodes, IEEE Trans. Electron Devices, 55 (2008) 1841-1846.

DOI: 10.1109/ted.2008.926643

Google Scholar

[4] Feng G Suda J , Kimoto T, Space-Modulated Junction Termination Extension for Ultrahigh-Voltage p-i-n Diodes in 4H-SiC, IEEE Trans. Electron Devices, 59 (2012) 414-418.

DOI: 10.1109/ted.2011.2175486

Google Scholar

[5] Rui Hu Xiaochuan Deng, Xiaojie Xu, An Improved Composite JTE Termination Technique for Ultrahigh Voltage 4H-SiC Power Devices, SSLChina: IFWS, (2019).

DOI: 10.1109/sslchinaifws49075.2019.9019794

Google Scholar

[6] Kaji N Niwa H, Suda J , Kimoto T, Temperature dependence of forward characteristics for ultrahigh-voltage SiC p–i–n diodes with a long carrier lifetime, IEEE Trans. Electron Devices, 62 (2015) 374-381.

DOI: 10.1109/ted.2014.2352279

Google Scholar

[7] Xiaochuan Deng Lijun Li, Jia Wu, A Multiple-Ring-Modulated JTE Technique for 4H-SiC Power Device With Improved JTE-Dose Window, IEEE Trans. Electron Devices, 64 (2017) 5042-5047.

DOI: 10.1109/ted.2017.2761995

Google Scholar

[8] A.O. Konstantinov Q. Wahab, N. Nordell, Et, Al Ionization rates and critical fields in 4H silicon carbide, Appl. Phys. Lett., 71 (1997) 90-92.

DOI: 10.1063/1.119478

Google Scholar

[9] Baliga B.J., Fundamentals of Power Semiconductor Devices, Springer (2008) 91.

Google Scholar