Bulk Electro- and Thermotransport in Nb
p.1655
p.1655
Electromigration in Thin Film Conductors
p.1661
p.1661
A new Insight into the Electromigration Behavior of Copper Interconnects: The Roles of Grain Boundary and Surface Diffusion
p.1673
p.1673
Field-Induced Diffusion along Grain Boundaries and Surfaces in Thin Films
p.1679
p.1679
Tracer Diffusion and Electrotransport in Indium-Doped Cobaltous Oxide {Co1-xInx}1-δO
p.1683
p.1683
Mass Effect of Effective Charge of Hydrogen Isotopes in Ta
p.1689
p.1689
Thermomigration of Zinc in Aluminium and Al-Zn Alloy
p.1693
p.1693
On the Effect of Superconducting Current on the Atomic Transport
p.1699
p.1699
Electrochemistry at Ion Conduction Microcontacts-Application to the Study of Ion Transport
p.1701
p.1701
Thermomigration of Zinc in Aluminium and Al-Zn Alloy
Abstract:
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Info:
Periodical:
Defect and Diffusion Forum (Volumes 143-147)
Pages:
1693-1698
Citation:
Online since:
January 1997
Authors:
Price:
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