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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 996Time-Resolved X-Ray Stress Analysis in...

Time-Resolved X-Ray Stress Analysis in Multilayered Thin Films during Continuous Loading: Use of 2D Remote Detection

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Abstract:

Synchrotron X-ray diffraction is a powerful tool to analyse the mechanical behavior of multiphase materials due to its selectivity. Simultaneous stress analysis of both phases of a W/Cu thin multilayer has been performed during a continuous biaxial loading on DiffAbs beamline at SOLEIL synchrotron (France). The use of a 2D detector with a large sample-detector distance is shown to give relatively accurate applied stress analysis even if only a small part of the usual ψ range of the sin2ψ method is considered. The results show the failure of the thin film multilayer while the W components are still under a strong compressive stress state of-3 GPa. It is concluded that the mechanical behavior is in fact mainly governed by the residual stress state.

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Residual Stresses IX

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Periodical:

Advanced Materials Research (Volume 996)

Pages:

878-883

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.996.878

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Online since:

August 2014

Authors:

Raphaëlle Guillou*, Pierre-Olivier Renault, Eric Le Bourhis, Philippe Goudeau, Pierre Godard, Guillaume Geandier, Damien Faurie, Dominique Thiaudière, Cristian Mocuta

Keywords:

2D Detector, Digital Image Correlation (DIC), In Situ Biaxial Tension Test, Nanostructured Thin Films, Strain Measurements, Stress Analysis, X-Ray Diffraction (XRD)

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[1] Clyne, T. W., Withers, P. J., an Introduction to Metal Matrix Composites, Cambridge University Press, (1995).

[2] Hoffman, D. W., Thornton, J. A., Thin Solid Films, 40 (1977) 355-363.

[3] Kumar, K. S., Van Swygenhoven, H., Suresh, S., Acta Mater., 51 (2003) 5743–5774.

[4] Geandier, G., Thiaudière, D., Randriamazaoro, R. N., Chiron, R., Djaziri, S., Lamongie, B., Diot, Y., Le Bourhis, E., Renault, P. O., Goudeau, P., Bouaffad, A., Castelnau, O., Faurie, D., Hild, F., Rev. Sci. Instrum, 81(2010) 103903.

DOI: 10.1063/1.3488628

[5] Hild, F., Roux, S., Gras, R., Guerrero, N., Marante, M., Florez-Lopez, J., Opt Lasers Eng, 47 (2009) 495-503.

[6] Djaziri, S., Renault, P. O., Hild, F., Le Bourhis, E., Goudeau, P., Thiaudière, D., Faurie, D., J. Appl. Cryst., 44 (2011) 1071-1079.

DOI: 10.1107/s0021889811030226

[7] Le Bourlot, C., Landois, P., Djaziri, S., Renault, P. O., Le Bourhis, E., Goudeau, P., Pinault, M., Mayne-L'Hermite, M., Bacroix, B., Faurie, D., Castelnau, O., Launois, P., Rouzière, S., J. Appl. Cryst., 45 (2012) 38-47.

DOI: 10.1107/s0021889811049107

[8] Medjoubi, K., Bucaille, T., Hustache, S., Berar, J. F., Boudet, N., Clemens, J. C., Delpierre, P., Dinkespiler, B., J. Synchrotron Rad., 17 (2010) 486-495.

DOI: 10.1107/s0909049510013257

[9] Faurie, D., Renault, P. O., Le Bourhis, E., Goudeau, P., J. Appl. Phys., 98 (2005) 093511.

[10] Faurie, D., Castelnau, O., Brenner, R., Renault, P. O., Le Bourhis, E., Goudeau, P., J. Appl. Cryst., 42 (2009) 1073-1084.

DOI: 10.1107/s0021889809037376

[11] Hauk. V, Structural and Residual Stress Analysis by Nonedestructive Methods, Elsevier, (1997).

[12] Welzel, U., Kumar, Mittemeijer, Appl. Phys. Lett., 95 (2009) 111907.

[13] Gergaud. P, Labat. S, Thomas. O, Thin Solid Films, 319 (1998) 9-15.

[14] Pina. J, Dias. A, Francois. M, Lebrun. J. L., Surf. Coat. Technol. 96 (1997) 148-162.

[15] Djaziri, S., Faurie, D., Renault, P. O., Le Bourhis, E., Goudeau, P., Geandier, G., Thiaudière, D., Acta Mater., 61 (2013) 5067-5077.

DOI: 10.1016/j.actamat.2013.04.031

[16] Cordill, M. J., Marx, V. M., Phil. Mag. Lett., 93 (2013) 618-624.

[17] Leterrier, Y., Prog. Mater. Sci, 48 (2003) 1.

[18] Roland, T., Arscott, S., Sabatier, L., Buchaillot, L., Charkaluk, E., J. Micromechanics Microengineering, 21 (2011) 125005.

DOI: 10.1088/0960-1317/21/12/125005

[19] Zhang, J. Y., Zhang, X., Liu, G., Zhang, G.J., Sun, J., Scripta Mater., 63 (2010) 101-104.

[20] Champion, Y., Langlois, S., Guerin-Mailly, P., Bonnentien, J. L., Hÿtch, M. J., Science, 300 (2003) 310.