Accuracy Analysis of Point Cloud Registration Based on Mark Point

Xin He Liang; Jian Wei Liu

doi:10.4028/www.scientific.net/AMR.945-949.2067

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 945-949Accuracy Analysis of Point Cloud Registration...

Accuracy Analysis of Point Cloud Registration Based on Mark Point

Abstract:

When optical 3D shape measurement equipment works, they gather dense point cloud using mark points as artificial feature for the purpose of global registration; as a result, rough registration error of multiple scans depends primarily on the location accuracy of these mark points. This paper analyses the 3D measuring error distribution law of the mark points in difference direction, proposes that the measurement error in z direction varies as positive proportion with z square, and inversely proportion with distance between two cameras.