Preparation and Characterization of Cd1-xZnxS Thin Films with Chemical Bath Deposition

Li Mei Zhou; Yun Long Li; Yue Jie Dong

doi:10.4028/www.scientific.net/AMR.1088.86

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 1088Preparation and Characterization of Cd1-xZnxS Thin...

Preparation and Characterization of Cd_1-xZn_xS Thin Films with Chemical Bath Deposition

Abstract:

Cd_1-xZn_xS thin films were grown on soda-lime glass substrates by chemical-bath deposition (CBD). The surface morphology, thickness, composition, state of the constituent elements and optical properties of the films were studied with X-ray diffraction (XRD), scanning electron microscopy (SEM), step height measurement instrument, X-ray photoelectron spectroscopy (XPS) and spectrophotometer, respectively. The affect of annealing for the Cd_1-xZn_xS thin films was studied. The Cd_1-xZn_xS thin films had cubic crystal structure and the average transmittance was 86.8% in the visible range with the optical band gap of 2.61eV and the films thickness was about 50nm. The atomic ratio of (Cd + Zn): S increased after annealing.

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Periodical:

Advanced Materials Research (Volume 1088)

Pages:

86-90

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1088.86

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Online since:

February 2015

Authors:

Li Mei Zhou*, Yun Long Li, Yue Jie Dong

Keywords:

Annealing, Cd_1-xZn_xS Thin Films, Chemical Bath Deposition, XPS

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